Young's modulus of ZnO microwires determined by various mechanical measurement methods

Hakseong Kim; Un Seok Jung; Soo In Kim; Duhee Yoon; Hyeonsik Cheong; Chang Woo Lee; Sang Wook Lee

doi:10.1016/j.cap.2013.10.018

Young's modulus of ZnO microwires determined by various mechanical measurement methods

Hakseong Kim, Un Seok Jung, Soo In Kim, Duhee Yoon, Hyeonsik Cheong, Chang Woo Lee, Sang Wook Lee

Department of Physics

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Abstract

The mechanical properties of ZnO microwires have been studied using three different methods: quasi-static flexural measurements using atomic force microscopy, static measurements using a nano indenter, and dynamic flexural measurements using optical interferometry. ZnO microwires were synthesized by chemical vapor deposition method, and the crystal structure and quality were examined using x-ray diffraction and photoluminescence spectroscopy. The Young's moduli were estimated using the measurement results from the three methods, and they showed consistent values in the range 67.5-79.4 GPa for microwires with diameters of 1.8 μm ± 100 nm

Original language	English
Pages (from-to)	166-170
Number of pages	5
Journal	Current Applied Physics
Volume	14
Issue number	2
DOIs	https://doi.org/10.1016/j.cap.2013.10.018
State	Published - 2014

Bibliographical note

Funding Information:
This work was supported through BSR ( 2011-0021207 , 2011-0017605 , 2012R1A2A2A01045496 ), and framework of international cooperation programs ( 2012K2A1A2032569 ) by the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology . SWL is partially supported by Konkuk University's research support program for its faculty on sabbatical leave in 2013.

Keywords

Atomic force microscope
Nano indentation
Optical interferometry
Young's modulus
ZnO microwire

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10.1016/j.cap.2013.10.018

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@article{7536befb3ecd42fd9385024f2fb14d1c,

title = "Young's modulus of ZnO microwires determined by various mechanical measurement methods",

abstract = "The mechanical properties of ZnO microwires have been studied using three different methods: quasi-static flexural measurements using atomic force microscopy, static measurements using a nano indenter, and dynamic flexural measurements using optical interferometry. ZnO microwires were synthesized by chemical vapor deposition method, and the crystal structure and quality were examined using x-ray diffraction and photoluminescence spectroscopy. The Young's moduli were estimated using the measurement results from the three methods, and they showed consistent values in the range 67.5-79.4 GPa for microwires with diameters of 1.8 μm ± 100 nm",

keywords = "Atomic force microscope, Nano indentation, Optical interferometry, Young's modulus, ZnO microwire",

author = "Hakseong Kim and Jung, {Un Seok} and Kim, {Soo In} and Duhee Yoon and Hyeonsik Cheong and Lee, {Chang Woo} and Lee, {Sang Wook}",

note = "Funding Information: This work was supported through BSR ( 2011-0021207 , 2011-0017605 , 2012R1A2A2A01045496 ), and framework of international cooperation programs ( 2012K2A1A2032569 ) by the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology . SWL is partially supported by Konkuk University's research support program for its faculty on sabbatical leave in 2013.",

year = "2014",

doi = "10.1016/j.cap.2013.10.018",

language = "English",

volume = "14",

pages = "166--170",

journal = "Current Applied Physics",

issn = "1567-1739",

publisher = "Elsevier",

number = "2",

}

TY - JOUR

T1 - Young's modulus of ZnO microwires determined by various mechanical measurement methods

AU - Kim, Hakseong

AU - Jung, Un Seok

AU - Kim, Soo In

AU - Yoon, Duhee

AU - Cheong, Hyeonsik

AU - Lee, Chang Woo

AU - Lee, Sang Wook

N1 - Funding Information: This work was supported through BSR ( 2011-0021207 , 2011-0017605 , 2012R1A2A2A01045496 ), and framework of international cooperation programs ( 2012K2A1A2032569 ) by the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology . SWL is partially supported by Konkuk University's research support program for its faculty on sabbatical leave in 2013.

PY - 2014

Y1 - 2014

N2 - The mechanical properties of ZnO microwires have been studied using three different methods: quasi-static flexural measurements using atomic force microscopy, static measurements using a nano indenter, and dynamic flexural measurements using optical interferometry. ZnO microwires were synthesized by chemical vapor deposition method, and the crystal structure and quality were examined using x-ray diffraction and photoluminescence spectroscopy. The Young's moduli were estimated using the measurement results from the three methods, and they showed consistent values in the range 67.5-79.4 GPa for microwires with diameters of 1.8 μm ± 100 nm

AB - The mechanical properties of ZnO microwires have been studied using three different methods: quasi-static flexural measurements using atomic force microscopy, static measurements using a nano indenter, and dynamic flexural measurements using optical interferometry. ZnO microwires were synthesized by chemical vapor deposition method, and the crystal structure and quality were examined using x-ray diffraction and photoluminescence spectroscopy. The Young's moduli were estimated using the measurement results from the three methods, and they showed consistent values in the range 67.5-79.4 GPa for microwires with diameters of 1.8 μm ± 100 nm

KW - Atomic force microscope

KW - Nano indentation

KW - Optical interferometry

KW - Young's modulus

KW - ZnO microwire

UR - http://www.scopus.com/inward/record.url?scp=84888377793&partnerID=8YFLogxK

U2 - 10.1016/j.cap.2013.10.018

DO - 10.1016/j.cap.2013.10.018

M3 - Article

AN - SCOPUS:84888377793

SN - 1567-1739

VL - 14

SP - 166

EP - 170

JO - Current Applied Physics

JF - Current Applied Physics

IS - 2

ER -

Young's modulus of ZnO microwires determined by various mechanical measurement methods

Abstract

Bibliographical note

Keywords

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