Young's modulus of ZnO microwires determined by various mechanical measurement methods

Hakseong Kim, Un Seok Jung, Soo In Kim, Duhee Yoon, Hyeonsik Cheong, Chang Woo Lee, Sang Wook Lee

Research output: Contribution to journalArticlepeer-review

14 Scopus citations


The mechanical properties of ZnO microwires have been studied using three different methods: quasi-static flexural measurements using atomic force microscopy, static measurements using a nano indenter, and dynamic flexural measurements using optical interferometry. ZnO microwires were synthesized by chemical vapor deposition method, and the crystal structure and quality were examined using x-ray diffraction and photoluminescence spectroscopy. The Young's moduli were estimated using the measurement results from the three methods, and they showed consistent values in the range 67.5-79.4 GPa for microwires with diameters of 1.8 μm ± 100 nm

Original languageEnglish
Pages (from-to)166-170
Number of pages5
JournalCurrent Applied Physics
Issue number2
StatePublished - 2014


  • Atomic force microscope
  • Nano indentation
  • Optical interferometry
  • Young's modulus
  • ZnO microwire


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