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Verification and Testing of the RTOS for Safety-Critical Embedded Systems

  • Na Young Lee
  • , Jin Hyun Kim
  • , Ah Young Sung
  • , Byoung Ju Choi
  • , Jin Young Choi
  • , Jang Soo Lee

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)201
Number of pages1
JournalTransactions of the American Nuclear Society
Volume89
StatePublished - 2003
EventInternational Conference on Nuclear Technology: Achieving Global Economic Growth While Safeguarding the Environment - New Orleans, LO, United States
Duration: 16 Nov 200320 Nov 2003

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