| Original language | English |
|---|---|
| Pages (from-to) | 201 |
| Number of pages | 1 |
| Journal | Transactions of the American Nuclear Society |
| Volume | 89 |
| State | Published - 2003 |
| Event | International Conference on Nuclear Technology: Achieving Global Economic Growth While Safeguarding the Environment - New Orleans, LO, United States Duration: 16 Nov 2003 → 20 Nov 2003 |
Verification and Testing of the RTOS for Safety-Critical Embedded Systems
Na Young Lee, Jin Hyun Kim, Ah Young Sung, Byoung Ju Choi, Jin Young Choi, Jang Soo Lee
Research output: Contribution to journal › Conference article › peer-review