Verification and Testing of the RTOS for Safety-Critical Embedded Systems

Na Young Lee, Jin Hyun Kim, Ah Young Sung, Byoung Ju Choi, Jin Young Choi, Jang Soo Lee

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)201
Number of pages1
JournalTransactions of the American Nuclear Society
StatePublished - 2003
EventInternational Conference on Nuclear Technology: Achieving Global Economic Growth While Safeguarding the Environment - New Orleans, LO, United States
Duration: 16 Nov 200320 Nov 2003

Cite this