Use of 2-Dimensional Arrays to Determine the Uniformity of Josephson Junctions

Jon S. Martens; Kookrin Char; Aleksandar Pance; Luke P. Lee; Marie E. Johansson; Stephen R. Whiteley; K. E. Kihlstrom; K. E. Kihlstrom; J. R. Wendt; Vincent M. Hietala; T. A. Plut; G. Allen Vawter; S. Y. Hou; Julia M. Phillips; W. Y. Lee

doi:10.1109/77.251809

Use of 2-Dimensional Arrays to Determine the Uniformity of Josephson Junctions

Jon S. Martens, Kookrin Char, Aleksandar Pance, Luke P. Lee, Marie E. Johansson, Stephen R. Whiteley, K. E. Kihlstrom, K. E. Kihlstrom, J. R. Wendt, Vincent M. Hietala, T. A. Plut, G. Allen Vawter, S. Y. Hou, Julia M. Phillips, W. Y. Lee

Department of Chemistry & Nanoscience

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

The linewidths of phase-locked, oscillating arrays of high temperature superconducting Josephson junctions have been used to estimate such statistical information for several junction processes using a fitting process to simulate results. Statistical data from arrays consisting of several hundred to many thousand junctions operating, and at least partially phase locked, at 77K are being used to characterize and improve junction processes. Spreads on critical currents for three different processes; step-edge, edge SNS and electron-beam defined nanobridges, have ranged from ±3% to 15% (1σ) and on normal state resistances from + 2% to 11%.

Original language	English
Pages (from-to)	3095-3101
Number of pages	7
Journal	IEEE Transactions on Applied Superconductivity
Volume	3
Issue number	4
DOIs	https://doi.org/10.1109/77.251809
State	Published - Dec 1993

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Martens, J. S., Char, K., Pance, A., Lee, L. P., Johansson, M. E., Whiteley, S. R., Kihlstrom, K. E., Kihlstrom, K. E., Wendt, J. R., Hietala, V. M., Plut, T. A., Vawter, G. A., Hou, S. Y., Phillips, J. M., & Lee, W. Y. (1993). Use of 2-Dimensional Arrays to Determine the Uniformity of Josephson Junctions. IEEE Transactions on Applied Superconductivity, 3(4), 3095-3101. https://doi.org/10.1109/77.251809

@article{3feb60412c054ab38af8478e7299d87b,

title = "Use of 2-Dimensional Arrays to Determine the Uniformity of Josephson Junctions",

abstract = "The linewidths of phase-locked, oscillating arrays of high temperature superconducting Josephson junctions have been used to estimate such statistical information for several junction processes using a fitting process to simulate results. Statistical data from arrays consisting of several hundred to many thousand junctions operating, and at least partially phase locked, at 77K are being used to characterize and improve junction processes. Spreads on critical currents for three different processes; step-edge, edge SNS and electron-beam defined nanobridges, have ranged from ±3% to 15% (1σ) and on normal state resistances from + 2% to 11%.",

author = "Martens, {Jon S.} and Kookrin Char and Aleksandar Pance and Lee, {Luke P.} and Johansson, {Marie E.} and Whiteley, {Stephen R.} and Kihlstrom, {K. E.} and Kihlstrom, {K. E.} and Wendt, {J. R.} and Hietala, {Vincent M.} and Plut, {T. A.} and Vawter, {G. Allen} and Hou, {S. Y.} and Phillips, {Julia M.} and Lee, {W. Y.}",

year = "1993",

month = dec,

doi = "10.1109/77.251809",

language = "English",

volume = "3",

pages = "3095--3101",

journal = "IEEE Transactions on Applied Superconductivity",

issn = "1051-8223",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "4",

}

Martens, JS, Char, K, Pance, A, Lee, LP, Johansson, ME, Whiteley, SR, Kihlstrom, KE, Kihlstrom, KE, Wendt, JR, Hietala, VM, Plut, TA, Vawter, GA, Hou, SY, Phillips, JM & Lee, WY 1993, 'Use of 2-Dimensional Arrays to Determine the Uniformity of Josephson Junctions', IEEE Transactions on Applied Superconductivity, vol. 3, no. 4, pp. 3095-3101. https://doi.org/10.1109/77.251809

TY - JOUR

T1 - Use of 2-Dimensional Arrays to Determine the Uniformity of Josephson Junctions

AU - Martens, Jon S.

AU - Char, Kookrin

AU - Pance, Aleksandar

AU - Lee, Luke P.

AU - Johansson, Marie E.

AU - Whiteley, Stephen R.

AU - Kihlstrom, K. E.

AU - Wendt, J. R.

AU - Hietala, Vincent M.

AU - Plut, T. A.

AU - Vawter, G. Allen

AU - Hou, S. Y.

AU - Phillips, Julia M.

AU - Lee, W. Y.

PY - 1993/12

Y1 - 1993/12

N2 - The linewidths of phase-locked, oscillating arrays of high temperature superconducting Josephson junctions have been used to estimate such statistical information for several junction processes using a fitting process to simulate results. Statistical data from arrays consisting of several hundred to many thousand junctions operating, and at least partially phase locked, at 77K are being used to characterize and improve junction processes. Spreads on critical currents for three different processes; step-edge, edge SNS and electron-beam defined nanobridges, have ranged from ±3% to 15% (1σ) and on normal state resistances from + 2% to 11%.

AB - The linewidths of phase-locked, oscillating arrays of high temperature superconducting Josephson junctions have been used to estimate such statistical information for several junction processes using a fitting process to simulate results. Statistical data from arrays consisting of several hundred to many thousand junctions operating, and at least partially phase locked, at 77K are being used to characterize and improve junction processes. Spreads on critical currents for three different processes; step-edge, edge SNS and electron-beam defined nanobridges, have ranged from ±3% to 15% (1σ) and on normal state resistances from + 2% to 11%.

UR - http://www.scopus.com/inward/record.url?scp=0027840979&partnerID=8YFLogxK

U2 - 10.1109/77.251809

DO - 10.1109/77.251809

M3 - Article

AN - SCOPUS:0027840979

SN - 1051-8223

VL - 3

SP - 3095

EP - 3101

JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

IS - 4

ER -

Use of 2-Dimensional Arrays to Determine the Uniformity of Josephson Junctions

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