Unraveling Sub-Nanostructure Variability in Amorphous Silicon: Mechanisms of Short-Range Order and Defect Dynamics via In Situ Raman Spectroscopy
- Dongyang Li
- , Jinyong Wang
- , Yujing Ren
- , Bo Wu
- , Tiancheng Zhao
- , Xun Cao
- , Deen Gu
- , Ming Xu
- , Jian Ma
- , Zhiqun Lin
Research output: Contribution to journal › Article › peer-review
4
Scopus
citations