Abstract
A model for the α-particle-induced charge collection has been developed. By accounting for the funnelling and diffusion charges separately, our model accurately describes the junction size dependence of collected charge for a wide range of junction sizes, substrate doping levels, and α-particle energies.
| Original language | English |
|---|---|
| Pages (from-to) | 1880-1882 |
| Number of pages | 3 |
| Journal | Electronics Letters |
| Volume | 32 |
| Issue number | 20 |
| DOIs | |
| State | Published - 1996 |
Keywords
- DRAMm chips
- Radiation effects
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