Abstract
A model for the α-particle-induced charge collection has been developed. By accounting for the funnelling and diffusion charges separately, our model accurately describes the junction size dependence of collected charge for a wide range of junction sizes, substrate doping levels, and α-particle energies.
Original language | English |
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Pages (from-to) | 1880-1882 |
Number of pages | 3 |
Journal | Electronics Letters |
Volume | 32 |
Issue number | 20 |
DOIs | |
State | Published - 1996 |
Keywords
- DRAMm chips
- Radiation effects