We investigated transport and local electrical properties of Pt/TiO 2 single crystal/Ti planar junctions with micron-sized gaps between the electrodes. Potential profiles, obtained by scanning Kelvin probe microscopy (SKPM), clearly showed that negative (positive) electrical stress to the Pt electrodes significantly reduced (hardly affected) the Pt/TiO2 contact resistance. In addition, the SKPM results revealed that the electrical stress caused modification of resistance and local work function of the TiO 2 surface. All the results suggested that the electrical stress caused alteration of physical properties at the TiO2 surface between the electrodes as well as the Pt/TiO2 interface.
|Number of pages||5|
|Journal||Applied Physics A: Materials Science and Processing|
|State||Published - Mar 2011|