Transport characteristics and surface potential distribution of electrically stressed TiO2 single crystals

Haeri Kim, Dong Wook Kim

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

We investigated transport and local electrical properties of Pt/TiO 2 single crystal/Ti planar junctions with micron-sized gaps between the electrodes. Potential profiles, obtained by scanning Kelvin probe microscopy (SKPM), clearly showed that negative (positive) electrical stress to the Pt electrodes significantly reduced (hardly affected) the Pt/TiO2 contact resistance. In addition, the SKPM results revealed that the electrical stress caused modification of resistance and local work function of the TiO 2 surface. All the results suggested that the electrical stress caused alteration of physical properties at the TiO2 surface between the electrodes as well as the Pt/TiO2 interface.

Original languageEnglish
Pages (from-to)949-953
Number of pages5
JournalApplied Physics A: Materials Science and Processing
Volume102
Issue number4
DOIs
StatePublished - Mar 2011

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