Towards Explainable Image Classifier: An Analogy to Multiple Choice Question Using Patch-level Similarity Measure

Yian Seo, Kyung Shik Shin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

With increased interests in Explainable Artificial Intelligence (XAI), many researches find ways to provide explanations for machine learning algorithms and their predictions. We propose Multiple Choice Questioned Convolutional Neural Network (MCQ-CNN) to better understand the prediction of image classifier by considering the problem of multi-class classification as the problem of multiple choice question. MCQ-CNN not only performs classification of the query image, but also explains the classification result by demonstrating the elimination process of multi-class labels in patch-level. The proposed model consists of two modules. Classification module is to classify class label of the query. Elimination module is to perform similarity measure in patch-level to distinguish whether the target object part shares the feature of certain class label or not. Classification module is trained using ResNet with high classification accuracy. Elimination module performs similarity measure by distance metric learning based on Large Margin Nearest Neighbor (LMNN). Our experiments have shown notable performances in both classification and elimination modules.

Original languageEnglish
Title of host publication2021 13th International Conference on Machine Learning and Computing, ICMLC 2021
PublisherAssociation for Computing Machinery
Pages310-317
Number of pages8
ISBN (Electronic)9781450389310
DOIs
StatePublished - 26 Feb 2021
Event2021 13th International Conference on Machine Learning and Computing, ICMLC 2021 - Virtual, Online, China
Duration: 26 Feb 20211 Mar 2021

Publication series

NameACM International Conference Proceeding Series

Conference

Conference2021 13th International Conference on Machine Learning and Computing, ICMLC 2021
Country/TerritoryChina
CityVirtual, Online
Period26/02/211/03/21

Bibliographical note

Publisher Copyright:
© 2021 ACM.

Keywords

  • Convolutional Neural Network
  • Distance metric learning
  • Explainable model
  • Image classification
  • Multiple Choice Question

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