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Thickness-Dependent Dielectric Constant of Few-Layer In2Se3 Nanoflakes
Di Wu, Alexander J. Pak, Yingnan Liu, Yu Zhou, Xiaoyu Wu, Yihan Zhu, Min Lin, Yu Han, Yuan Ren, Hailin Peng, Yu Hao Tsai, Gyeong S. Hwang, Keji Lai
Research output: Contribution to journal › Article › peer-review
89
Scopus
citations