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Thickness dependence of critical currents and depth profiling of transport properties in high rate in-situ grown YBa2Cu3O7-x films

  • W. Jo
  • , T. Ohnishi
  • , J. U. Huh
  • , R. H. Hammond
  • , M. R. Beasley

Research output: Contribution to journal › Conference article › peer-review

10 Scopus citations

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