Thickness dependence of critical currents and depth profiling of transport properties in high rate in-situ grown YBa2Cu3O7-x films

W. Jo; T. Ohnishi; J. U. Huh; R. H. Hammond; M. R. Beasley

doi:10.1109/TASC.2003.812015

Thickness dependence of critical currents and depth profiling of transport properties in high rate in-situ grown YBa₂Cu₃O_7-x films

W. Jo, T. Ohnishi, J. U. Huh, R. H. Hammond, M. R. Beasley

Department of Physics

Research output: Contribution to journal › Conference article › peer-review

10 Scopus citations

Abstract

YBa₂Cu₃O_7-x (YBCO) films are grown by in-situ electron beam evaporation at high deposition rates (100 ∼ 350 Å/sec. The YBCO films are found to consist of two regions as a function of thickness: a region on the bottom with defect-free microstructure reflecting layer-by-layer growth and at the top a defected type reflecting island-growth. We suggested a new phase stability to explain this growth behavior, with Ba-Cu-O liquid fluxes. The films show critical current density greater than 2 MA/cm² on crystal substrates. Depth profiling of the transport properties (critical current density and resistivity) has been performed by etching the layers, elucidating that it is the island-growth layer where high critical current density is being carried.

Original language	English
Pages (from-to)	2817-2820
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	13
Issue number	2 III
DOIs	https://doi.org/10.1109/TASC.2003.812015
State	Published - Jun 2003
Event	2002 Applied Superconductivity Conference - Houston, TX, United States Duration: 4 Aug 2002 → 9 Aug 2002

Bibliographical note

Funding Information:
Manuscript received August 6, 2002. This work was supported by Grant F49620-01-0103 by the Air Force Office of Scientific Research.

Keywords

Critical current
Depth profiling
High rate deposition
In-situ growth
Thickness dependence
YBaCuO films

Access to Document

10.1109/TASC.2003.812015

Cite this

@article{9d352d58211740409f7481fc6f31f352,

title = "Thickness dependence of critical currents and depth profiling of transport properties in high rate in-situ grown YBa2Cu3O7-x films",

abstract = "YBa2Cu3O7-x (YBCO) films are grown by in-situ electron beam evaporation at high deposition rates (100 ∼ 350 {\AA}/sec. The YBCO films are found to consist of two regions as a function of thickness: a region on the bottom with defect-free microstructure reflecting layer-by-layer growth and at the top a defected type reflecting island-growth. We suggested a new phase stability to explain this growth behavior, with Ba-Cu-O liquid fluxes. The films show critical current density greater than 2 MA/cm2 on crystal substrates. Depth profiling of the transport properties (critical current density and resistivity) has been performed by etching the layers, elucidating that it is the island-growth layer where high critical current density is being carried.",

keywords = "Critical current, Depth profiling, High rate deposition, In-situ growth, Thickness dependence, YBaCuO films",

author = "W. Jo and T. Ohnishi and Huh, {J. U.} and Hammond, {R. H.} and Beasley, {M. R.}",

note = "Funding Information: Manuscript received August 6, 2002. This work was supported by Grant F49620-01-0103 by the Air Force Office of Scientific Research.; 2002 Applied Superconductivity Conference ; Conference date: 04-08-2002 Through 09-08-2002",

year = "2003",

month = jun,

doi = "10.1109/TASC.2003.812015",

language = "English",

volume = "13",

pages = "2817--2820",

journal = "IEEE Transactions on Applied Superconductivity",

issn = "1051-8223",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "2 III",

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TY - JOUR

T1 - Thickness dependence of critical currents and depth profiling of transport properties in high rate in-situ grown YBa2Cu3O7-x films

AU - Jo, W.

AU - Ohnishi, T.

AU - Huh, J. U.

AU - Hammond, R. H.

AU - Beasley, M. R.

N1 - Funding Information: Manuscript received August 6, 2002. This work was supported by Grant F49620-01-0103 by the Air Force Office of Scientific Research.

PY - 2003/6

Y1 - 2003/6

N2 - YBa2Cu3O7-x (YBCO) films are grown by in-situ electron beam evaporation at high deposition rates (100 ∼ 350 Å/sec. The YBCO films are found to consist of two regions as a function of thickness: a region on the bottom with defect-free microstructure reflecting layer-by-layer growth and at the top a defected type reflecting island-growth. We suggested a new phase stability to explain this growth behavior, with Ba-Cu-O liquid fluxes. The films show critical current density greater than 2 MA/cm2 on crystal substrates. Depth profiling of the transport properties (critical current density and resistivity) has been performed by etching the layers, elucidating that it is the island-growth layer where high critical current density is being carried.

AB - YBa2Cu3O7-x (YBCO) films are grown by in-situ electron beam evaporation at high deposition rates (100 ∼ 350 Å/sec. The YBCO films are found to consist of two regions as a function of thickness: a region on the bottom with defect-free microstructure reflecting layer-by-layer growth and at the top a defected type reflecting island-growth. We suggested a new phase stability to explain this growth behavior, with Ba-Cu-O liquid fluxes. The films show critical current density greater than 2 MA/cm2 on crystal substrates. Depth profiling of the transport properties (critical current density and resistivity) has been performed by etching the layers, elucidating that it is the island-growth layer where high critical current density is being carried.

KW - Critical current

KW - Depth profiling

KW - High rate deposition

KW - In-situ growth

KW - Thickness dependence

KW - YBaCuO films

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U2 - 10.1109/TASC.2003.812015

DO - 10.1109/TASC.2003.812015

M3 - Conference article

AN - SCOPUS:0041474570

SN - 1051-8223

VL - 13

SP - 2817

EP - 2820

JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

IS - 2 III

T2 - 2002 Applied Superconductivity Conference

Y2 - 4 August 2002 through 9 August 2002

ER -