Test sequence generation scheme satisfying the completeness criteria

Hong Se Son, Dae Hun Nyang, Jin Ho Park, Sang Yong Lim, Byung Moon Chin, Jun Won Lee, Joo Seok Song

Research output: Contribution to conferencePaperpeer-review

Abstract

We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we illustrate our technique on a specific example.

Original languageEnglish
Pages560-563
Number of pages4
StatePublished - 1997
EventProceedings of the 1997 6th IEEE Pacific Rim Conference on Communications, Computers and Signal Processing. Part 1 (of 2) - Victoria, Can
Duration: 20 Aug 199722 Aug 1997

Conference

ConferenceProceedings of the 1997 6th IEEE Pacific Rim Conference on Communications, Computers and Signal Processing. Part 1 (of 2)
CityVictoria, Can
Period20/08/9722/08/97

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