Test sequence generation scheme satisfying the completeness criteria

Hong Se Son; Dae Hun Nyang; Jin Ho Park; Sang Yong Lim; Byung Moon Chin; Jun Won Lee; Joo Seok Song

Test sequence generation scheme satisfying the completeness criteria

Hong Se Son, Dae Hun Nyang, Jin Ho Park, Sang Yong Lim, Byung Moon Chin, Jun Won Lee, Joo Seok Song

Department of Cyber Security

Research output: Contribution to conference › Paper › peer-review

Abstract

We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we illustrate our technique on a specific example.

Original language	English
Pages	560-563
Number of pages	4
State	Published - 1997
Event	Proceedings of the 1997 6th IEEE Pacific Rim Conference on Communications, Computers and Signal Processing. Part 1 (of 2) - Victoria, Can Duration: 20 Aug 1997 → 22 Aug 1997

Conference

Conference	Proceedings of the 1997 6th IEEE Pacific Rim Conference on Communications, Computers and Signal Processing. Part 1 (of 2)
City	Victoria, Can
Period	20/08/97 → 22/08/97

Cite this

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title = "Test sequence generation scheme satisfying the completeness criteria",

abstract = "We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we illustrate our technique on a specific example.",

author = "Son, {Hong Se} and Nyang, {Dae Hun} and Park, {Jin Ho} and Lim, {Sang Yong} and Chin, {Byung Moon} and Lee, {Jun Won} and Song, {Joo Seok}",

year = "1997",

language = "English",

pages = "560--563",

note = "Proceedings of the 1997 6th IEEE Pacific Rim Conference on Communications, Computers and Signal Processing. Part 1 (of 2) ; Conference date: 20-08-1997 Through 22-08-1997",

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TY - CONF

T1 - Test sequence generation scheme satisfying the completeness criteria

AU - Son, Hong Se

AU - Nyang, Dae Hun

AU - Park, Jin Ho

AU - Lim, Sang Yong

AU - Chin, Byung Moon

AU - Lee, Jun Won

AU - Song, Joo Seok

PY - 1997

Y1 - 1997

N2 - We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we illustrate our technique on a specific example.

AB - We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we illustrate our technique on a specific example.

UR - http://www.scopus.com/inward/record.url?scp=0031364872&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0031364872

SP - 560

EP - 563

T2 - Proceedings of the 1997 6th IEEE Pacific Rim Conference on Communications, Computers and Signal Processing. Part 1 (of 2)

Y2 - 20 August 1997 through 22 August 1997

ER -

Test sequence generation scheme satisfying the completeness criteria

Abstract

Conference

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