Ten-Micrometer-Thick Si Wafers with Ag Nanoclusters: Substrate Effects on Plasmon-Enhanced Optical Absorption

Sujung Kim, Yunae Cho, Ahrum Sohn, Dong Wook Kim

Research output: Contribution to journalArticlepeer-review

Abstract

We present the optical characteristics of 10-μm-thick crystalline Si wafers with an Ag heptamer nanocluster (NC) array, using a finite-difference time-domain method. The anti-reflection properties of the Ag NC array were more pronounced at long wavelengths, with respect to a monomer array, resulting in significantly enhanced optical absorption in the underlying Si wafer. The scattering cross-section spectra of the NC on the Si wafer exhibited one broad peak with a kink, whereas those in air showed two broad peaks and a sharp Fano dip between them. The high refractive index Si wafer weakened the near-field coupling between particles in the NCs, which modified the optical cross-sections of the Ag NC more drastically than those of the Ag monomer. Therefore, the implementation of the NC nanoantennae for Si-based optoelectronic devices requires careful consideration of the substrate effects.

Original languageEnglish
Pages (from-to)405-410
Number of pages6
JournalPlasmonics
Volume12
Issue number2
DOIs
StatePublished - 1 Apr 2017

Keywords

  • Ag heptamer
  • Anti-reflection effect
  • Plasmonic nanoantennae
  • Silicon wafer

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