Temperature-assisted morphological transition in CuPc thin films

Yu Jeong Bae, Thi Kim Hang Pham, Tae Hee Kim

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Ex-situ and in-situ morphological analyses were performed for Cu-phthalocyanine (CuPc) organic semiconductor films by using atomic force microscopy (AFM) and reflection high-energy electron diffraction (RHEED). The focus was the effects of post-annealing on the structural characteristics of CuPc films grown on MgO(001) layers by using an ultra-high-vacuum thermal evaporator. Sphere-to-nanofibril and 2-D to 3-D morphological transitions were observed with increasing CuPc thickness beyond 3 nm. The surface morphology and the crystallinity were drastically improved after an additional cooling of the post-annealed CuPc films thinner than 3 nm. Our results highlight that molecular orientation and structural ordering can be effectively controlled by using different temperature treatments and a proper combination of material, film thickness, and substrate.

Original languageEnglish
Pages (from-to)1206-1210
Number of pages5
JournalJournal of the Korean Physical Society
Issue number10
StatePublished - 1 May 2016

Bibliographical note

Publisher Copyright:
© 2016, The Korean Physical Society.


  • Cuphthalocyanine
  • Morphological transition
  • Organic semiconductor thin film
  • Temperature treatment


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