Tailoring test process by using the component-based development paradigm and the XML technology

Jooyoung Seo, Byoungju Choi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

ISO (International Standardization Organization) and the IEC (International Electrotechnical Commission) provide numerous standards for software products and processes. Utilizing those standards specific to a project requires some tailoring to meet the development domain. This paper includes: (1) a test process meta-model, which is a test process defined in standards; (2) "a scheme for tailoring processes" following a component-based development customization technique; and (3) AutoTP, an "automation tool for tailoring", which is derived from XML techniques. AutoTP is a tool in which a standard test process automatically generates a tailored test process by means of a methodology and a domain. In addition, the Rational Objectory process is used as an empirical study in this paper.

Original languageEnglish
Title of host publicationProceedings - 7th Asia-Pacific Software Engineering Conference, APSEC 2000
PublisherIEEE Computer Society
Pages356-363
Number of pages8
ISBN (Electronic)0769509150
DOIs
StatePublished - 2000
Event7th Asia-Pacific Software Engineering Conference, APSEC 2000 - Singapore, Singapore
Duration: 5 Dec 20008 Dec 2000

Publication series

NameProceedings - Asia-Pacific Software Engineering Conference, APSEC
Volume2000-January
ISSN (Print)1530-1362

Conference

Conference7th Asia-Pacific Software Engineering Conference, APSEC 2000
Country/TerritorySingapore
CitySingapore
Period5/12/008/12/00

Bibliographical note

Publisher Copyright:
© 2000 IEEE.

Keywords

  • Automatic testing
  • Automation
  • Component architectures
  • Computer science
  • IEC standards
  • ISO standards
  • Software standards
  • Standards development
  • Standards organizations
  • XML

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