Synthesis and transport properties of La2 - xSrxCuO4 thin films deposited by laser ablation

G. C. Yi; W. Jo; Y. K. Kim; T. W. Noh; D. K. Ko; H. Noh; Z. G. Khim

doi:10.1016/S0921-4534(05)80007-3

Synthesis and transport properties of La_{2 - x}Sr_xCuO₄ thin films deposited by laser ablation

G. C. Yi, W. Jo, Y. K. Kim, T. W. Noh, D. K. Ko, H. Noh, Z. G. Khim

Department of Physics

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

La_{2 - x}Sr_xCuO₄ high-T_c thin films are fabricated in situ using second harmonics of a pulsed Nd:YAG laser. Effects of the growth parameters, such as substrate temperature and oxygen pressure, on the physical properties of the films are investigated with resistance and X-ray diffractometry measurements. The films deposited on SrTiO₃ (100) and MgO (100) substrates have zero resistance transition temperatures around 22 K. Most grains in these films are aligned with their c-axes perpendicular to the substrates. The current-voltage (I-V) characteristics of a patterned La_{2 - x}Sr_xCuO₄ thin film are measured at various temperatures near T_c. From the I-V characteristic curves, it is found that the measured critical current density (J_c) follows a power law J_c ∞ (1 - T/T_c)ⁿ with n ∼ 1.5. Also, the behaviors of the I-V curves are discussed in terms of the scaling theory of the vortex-glass model.

Original language	English
Pages (from-to)	293-300
Number of pages	8
Journal	Physica C: Superconductivity and its Applications
Volume	194
Issue number	3-4
DOIs	https://doi.org/10.1016/S0921-4534(05)80007-3
State	Published - 10 May 1992

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@article{0b83c4735a2945c4ad72c22fc8b06298,

title = "Synthesis and transport properties of La2 - xSrxCuO4 thin films deposited by laser ablation",

abstract = "La2 - xSrxCuO4 high-Tc thin films are fabricated in situ using second harmonics of a pulsed Nd:YAG laser. Effects of the growth parameters, such as substrate temperature and oxygen pressure, on the physical properties of the films are investigated with resistance and X-ray diffractometry measurements. The films deposited on SrTiO3 (100) and MgO (100) substrates have zero resistance transition temperatures around 22 K. Most grains in these films are aligned with their c-axes perpendicular to the substrates. The current-voltage (I-V) characteristics of a patterned La2 - xSrxCuO4 thin film are measured at various temperatures near Tc. From the I-V characteristic curves, it is found that the measured critical current density (Jc) follows a power law Jc ∞ (1 - T/Tc)n with n ∼ 1.5. Also, the behaviors of the I-V curves are discussed in terms of the scaling theory of the vortex-glass model.",

author = "Yi, {G. C.} and W. Jo and Kim, {Y. K.} and Noh, {T. W.} and Ko, {D. K.} and H. Noh and Khim, {Z. G.}",

year = "1992",

month = may,

day = "10",

doi = "10.1016/S0921-4534(05)80007-3",

language = "English",

volume = "194",

pages = "293--300",

journal = "Physica C: Superconductivity and its Applications",

issn = "0921-4534",

publisher = "Elsevier",

number = "3-4",

}

TY - JOUR

T1 - Synthesis and transport properties of La2 - xSrxCuO4 thin films deposited by laser ablation

AU - Yi, G. C.

AU - Jo, W.

AU - Kim, Y. K.

AU - Noh, T. W.

AU - Ko, D. K.

AU - Noh, H.

AU - Khim, Z. G.

PY - 1992/5/10

Y1 - 1992/5/10

N2 - La2 - xSrxCuO4 high-Tc thin films are fabricated in situ using second harmonics of a pulsed Nd:YAG laser. Effects of the growth parameters, such as substrate temperature and oxygen pressure, on the physical properties of the films are investigated with resistance and X-ray diffractometry measurements. The films deposited on SrTiO3 (100) and MgO (100) substrates have zero resistance transition temperatures around 22 K. Most grains in these films are aligned with their c-axes perpendicular to the substrates. The current-voltage (I-V) characteristics of a patterned La2 - xSrxCuO4 thin film are measured at various temperatures near Tc. From the I-V characteristic curves, it is found that the measured critical current density (Jc) follows a power law Jc ∞ (1 - T/Tc)n with n ∼ 1.5. Also, the behaviors of the I-V curves are discussed in terms of the scaling theory of the vortex-glass model.

AB - La2 - xSrxCuO4 high-Tc thin films are fabricated in situ using second harmonics of a pulsed Nd:YAG laser. Effects of the growth parameters, such as substrate temperature and oxygen pressure, on the physical properties of the films are investigated with resistance and X-ray diffractometry measurements. The films deposited on SrTiO3 (100) and MgO (100) substrates have zero resistance transition temperatures around 22 K. Most grains in these films are aligned with their c-axes perpendicular to the substrates. The current-voltage (I-V) characteristics of a patterned La2 - xSrxCuO4 thin film are measured at various temperatures near Tc. From the I-V characteristic curves, it is found that the measured critical current density (Jc) follows a power law Jc ∞ (1 - T/Tc)n with n ∼ 1.5. Also, the behaviors of the I-V curves are discussed in terms of the scaling theory of the vortex-glass model.

UR - http://www.scopus.com/inward/record.url?scp=0026866676&partnerID=8YFLogxK

U2 - 10.1016/S0921-4534(05)80007-3

DO - 10.1016/S0921-4534(05)80007-3

M3 - Article

AN - SCOPUS:0026866676

SN - 0921-4534

VL - 194

SP - 293

EP - 300

JO - Physica C: Superconductivity and its Applications

JF - Physica C: Superconductivity and its Applications

IS - 3-4

ER -

Synthesis and transport properties of La2 - xSrxCuO4 thin films deposited by laser ablation

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Synthesis and transport properties of La_{2 - x}Sr_xCuO₄ thin films deposited by laser ablation