Switching Time and Stability Evaluation for Writing Operation of STT-MRAM Crossbar Array

Hyein Lim, Seungjun Lee, Hyungsoon Shin

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

The dynamic characteristics of a spin transfer torque magnetoresistive random access memory crossbar array during write operations were investigated. A spin transfer torque magnetic tunnel junction was combined with a two-terminal selector device instead of a three-terminal CMOS transistor in the crossbar array architecture. The characteristics of the crossbar array architecture were investigated under different bias schemes and transient simulations of write operations were performed under various operating conditions. The variance of the switching time and problematic behaviors was investigated. The floating bias scheme was compared with the 1/2 bias scheme, and simulation results revealed that write errors may be induced in the floating bias scheme by abnormal glitches occurring when the parasitic capacitance becomes large.

Original languageEnglish
Article number7555375
Pages (from-to)3914-3921
Number of pages8
JournalIEEE Transactions on Electron Devices
Volume63
Issue number10
DOIs
StatePublished - Oct 2016

Keywords

  • Crossbar array
  • magnetoresistive random access memory (MRAM)
  • nonvolatile memory
  • spin-transfer torque

Fingerprint

Dive into the research topics of 'Switching Time and Stability Evaluation for Writing Operation of STT-MRAM Crossbar Array'. Together they form a unique fingerprint.

Cite this