Surface versus bulk characterizations of electronic inhomogeneity in a V O2 thin film

  • Y. J. Chang
  • , J. S. Yang
  • , Y. S. Kim
  • , D. H. Kim
  • , T. W. Noh
  • , D. W. Kim
  • , E. Oh
  • , B. Kahng
  • , J. S. Chung

Research output: Contribution to journal › Article › peer-review

60 Scopus citations

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