Surface versus bulk characterizations of electronic inhomogeneity in a V O2 thin film

Y. J. Chang, J. S. Yang, Y. S. Kim, D. H. Kim, T. W. Noh, D. W. Kim, E. Oh, B. Kahng, J. S. Chung

Research output: Contribution to journalArticlepeer-review

59 Scopus citations

Fingerprint

Dive into the research topics of 'Surface versus bulk characterizations of electronic inhomogeneity in a V O2 thin film'. Together they form a unique fingerprint.

Material Science