Surface roughness effect on Q-factor of ge whispering gallery mode microdisk resonator

Seongjae Cho, Sukmo Koo, Kyungwan Yoo, Evan R. Pickett, Namkyoo Park, Theodore I. Kamins, Byung Gook Park, James S. Harris

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, surface roughness effect on Q-factor of Ge whispering gallery mode (WGM) microdisk resonator is thoroughly investigated by 2D and 3D finite-difference timedomain (FDTD) simulation. Results reveal that the effective radius of nanohole along a microdisk perimeter, roughness index, significantly degrades the device Q-factor and should be sub-100 nm.

Original languageEnglish
Title of host publicationSpecialty Optical Fibers, SOF 2011
PublisherOptical Society of America (OSA)
ISBN (Print)9781557529138
DOIs
StatePublished - 2011
EventSpecialty Optical Fibers, SOF 2011 - Toronto, Canada
Duration: 12 Jun 201115 Jun 2011

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceSpecialty Optical Fibers, SOF 2011
Country/TerritoryCanada
CityToronto
Period12/06/1115/06/11

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