In this paper, surface roughness effect on Q-factor of Ge whispering gallery mode (WGM) microdisk resonator is thoroughly investigated by 2D and 3D finite-difference timedomain (FDTD) simulation. Results reveal that the effective radius of nanohole along a microdisk perimeter, roughness index, significantly degrades the device Q-factor and should be sub-100 nm.
|Title of host publication||Slow and Fast Light, Slow_Fast 2011|
|State||Published - 2011|
|Event||Slow and Fast Light, Slow_Fast 2011 - Toronto, Canada|
Duration: 12 Jun 2011 → 15 Jun 2011
|Name||Optics InfoBase Conference Papers|
|Conference||Slow and Fast Light, Slow_Fast 2011|
|Period||12/06/11 → 15/06/11|