Abstract
We investigated surface potential profiles for pentacene films as a function of the film thickness and the contact metallurgy (Au and Al) by using a near-field microwave microprobe analysis and Kelvin-probe force microscopy. The surface potential for the Al/pentacene bilayers increased monotonically with the thickness of pentacene while no thickness dependence of the surface potential was for the Au/pentacene bilayers. These results are discussed based on the potential barrier at the metal/pentacene interface due to the space charge.
| Original language | English |
|---|---|
| Pages (from-to) | L2226-L2229 |
| Journal | Journal of the Korean Physical Society |
| Volume | 49 |
| Issue number | 6 |
| State | Published - Dec 2006 |
Keywords
- Kelvin-probe method
- Near-field microwave microscope
- Pentacene
- Reflection coefficient
- Surface potential
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