Surface potential of pentacene films and contact metallurgy for organic-based electronic applications

Kiejin Lee, Tae Hee Kim

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

We investigated surface potential profiles for pentacene films as a function of the film thickness and the contact metallurgy (Au and Al) by using a near-field microwave microprobe analysis and Kelvin-probe force microscopy. The surface potential for the Al/pentacene bilayers increased monotonically with the thickness of pentacene while no thickness dependence of the surface potential was for the Au/pentacene bilayers. These results are discussed based on the potential barrier at the metal/pentacene interface due to the space charge.

Original languageEnglish
Pages (from-to)L2226-L2229
JournalJournal of the Korean Physical Society
Volume49
Issue number6
StatePublished - Dec 2006

Keywords

  • Kelvin-probe method
  • Near-field microwave microscope
  • Pentacene
  • Reflection coefficient
  • Surface potential

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