Surface charging and impulsive ion ejection during ultrashort pulsed laser ablation

R. Stoian, A. Rosenfeld, D. Ashkenasi, I. V. Hertel, N. M. Bulgakova, E. E. Campbell

Research output: Contribution to journalArticlepeer-review

250 Scopus citations

Abstract

The dynamics of electronic and lattice excitation and material removal in ultrafast laser ablation of dielectrics, semiconductors, and metals was studied experimentally and theoretically. Dielectrics were strongly charged at the surface on the femtosecond time scale and underwent an impulsive Coulomb explosion. The calculations were found in good agreement with femtosecond pump-probe studies and measurements of velocity distributions of emitted ions.

Original languageEnglish
Article number097603
Pages (from-to)976031-976034
Number of pages4
JournalPhysical Review Letters
Volume88
Issue number9
DOIs
StatePublished - 4 Mar 2002

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