Surface charging and impulsive ion ejection during ultrashort pulsed laser ablation

R. Stoian; A. Rosenfeld; D. Ashkenasi; I. V. Hertel; N. M. Bulgakova; E. E. Campbell

doi:10.1103/PhysRevLett.88.097603

Surface charging and impulsive ion ejection during ultrashort pulsed laser ablation

R. Stoian, A. Rosenfeld, D. Ashkenasi, I. V. Hertel, N. M. Bulgakova, E. E. Campbell

Department of Physics

Research output: Contribution to journal › Article › peer-review

262 Scopus citations

Abstract

The dynamics of electronic and lattice excitation and material removal in ultrafast laser ablation of dielectrics, semiconductors, and metals was studied experimentally and theoretically. Dielectrics were strongly charged at the surface on the femtosecond time scale and underwent an impulsive Coulomb explosion. The calculations were found in good agreement with femtosecond pump-probe studies and measurements of velocity distributions of emitted ions.

Original language	English
Article number	097603
Pages (from-to)	976031-976034
Number of pages	4
Journal	Physical Review Letters
Volume	88
Issue number	9
DOIs	https://doi.org/10.1103/PhysRevLett.88.097603
State	Published - 4 Mar 2002

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10.1103/PhysRevLett.88.097603

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AU - Campbell, E. E.

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Surface charging and impulsive ion ejection during ultrashort pulsed laser ablation

Abstract

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