Study on the application of SiPM to γ ray and charged particle measurement using scintillation crystals

S. Bae, J. W. Hwang, S. Ahn, S. M. Cha, K. I. Hahn, D. Kim, Y. H. Kim, C. Park, X. Pereira López, C. Kim

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Fingerprint

Dive into the research topics of 'Study on the application of SiPM to γ ray and charged particle measurement using scintillation crystals'. Together they form a unique fingerprint.

Engineering

Physics