Abstract
Ferroelectric bismuth titanate thin films have been deposited on LaA103, SrTi03, MgO, Al2O3, and ZrO2/SiO2/Si substrates using a Q-switched Nd:YAG laser. X-ray diffraction studies show that most films on single crystal substrates have preferential crystallographic orientation. The film on MgO(11O) shows large electrooptic characteristics with an effective electrooptic coefficient of about 3.8xl0-15 m2/V2. Using a lens coupling method, it is demonstrated that light can propagate along the Bi4Ti3O12 layer in a Bi4Ti3O12/ZrO2/SiO2/Si(100) heterostructure.
Original language | English |
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Pages (from-to) | 139-144 |
Number of pages | 6 |
Journal | Ferroelectrics |
Volume | 152 |
Issue number | 1 |
DOIs | |
State | Published - Feb 1994 |
Bibliographical note
Funding Information:This work is supported by Korea Telecom Research Center and by the KOSEF through the Science Research Center of Excellence Program.