Studies on structural and electrooptic properties of ferroelectric bismuth titanate thin films

W. Jo, H. J. Cho, T. W. Noh, Y. S. Cho, S. I. Kwun, Y. T. Byun, S. H. Kim

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

Ferroelectric bismuth titanate thin films have been deposited on LaA103, SrTi03, MgO, Al2O3, and ZrO2/SiO2/Si substrates using a Q-switched Nd:YAG laser. X-ray diffraction studies show that most films on single crystal substrates have preferential crystallographic orientation. The film on MgO(11O) shows large electrooptic characteristics with an effective electrooptic coefficient of about 3.8xl0-15 m2/V2. Using a lens coupling method, it is demonstrated that light can propagate along the Bi4Ti3O12 layer in a Bi4Ti3O12/ZrO2/SiO2/Si(100) heterostructure.

Original languageEnglish
Pages (from-to)139-144
Number of pages6
JournalFerroelectrics
Volume152
Issue number1
DOIs
StatePublished - Feb 1994

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