Studies on structural and electrooptic properties of ferroelectric bismuth titanate thin films

W. Jo; H. J. Cho; T. W. Noh; Y. S. Cho; S. I. Kwun; Y. T. Byun; S. H. Kim

doi:10.1080/00150199408017610

Studies on structural and electrooptic properties of ferroelectric bismuth titanate thin films

W. Jo, H. J. Cho, T. W. Noh, Y. S. Cho, S. I. Kwun, Y. T. Byun, S. H. Kim

Department of Physics

Research output: Contribution to journal › Article › peer-review

Abstract

Ferroelectric bismuth titanate thin films have been deposited on LaA103, SrTi03, MgO, Al2O3, and ZrO2/SiO2/Si substrates using a Q-switched Nd:YAG laser. X-ray diffraction studies show that most films on single crystal substrates have preferential crystallographic orientation. The film on MgO(11O) shows large electrooptic characteristics with an effective electrooptic coefficient of about 3.8xl0-15 m2/V2. Using a lens coupling method, it is demonstrated that light can propagate along the Bi4Ti3O12 layer in a Bi4Ti3O12/ZrO2/SiO2/Si(100) heterostructure.

Original language	English
Pages (from-to)	139-144
Number of pages	6
Journal	Ferroelectrics
Volume	152
Issue number	1
DOIs	https://doi.org/10.1080/00150199408017610
State	Published - Feb 1994

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title = "Studies on structural and electrooptic properties of ferroelectric bismuth titanate thin films",

abstract = "Ferroelectric bismuth titanate thin films have been deposited on LaA103, SrTi03, MgO, Al2O3, and ZrO2/SiO2/Si substrates using a Q-switched Nd:YAG laser. X-ray diffraction studies show that most films on single crystal substrates have preferential crystallographic orientation. The film on MgO(11O) shows large electrooptic characteristics with an effective electrooptic coefficient of about 3.8xl0-15 m2/V2. Using a lens coupling method, it is demonstrated that light can propagate along the Bi4Ti3O12 layer in a Bi4Ti3O12/ZrO2/SiO2/Si(100) heterostructure.",

author = "W. Jo and Cho, {H. J.} and Noh, {T. W.} and Cho, {Y. S.} and Kwun, {S. I.} and Byun, {Y. T.} and Kim, {S. H.}",

note = "Funding Information: This work is supported by Korea Telecom Research Center and by the KOSEF through the Science Research Center of Excellence Program.",

year = "1994",

month = feb,

doi = "10.1080/00150199408017610",

language = "English",

volume = "152",

pages = "139--144",

journal = "Ferroelectrics",

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TY - JOUR

T1 - Studies on structural and electrooptic properties of ferroelectric bismuth titanate thin films

AU - Jo, W.

AU - Cho, H. J.

AU - Noh, T. W.

AU - Cho, Y. S.

AU - Kwun, S. I.

AU - Byun, Y. T.

AU - Kim, S. H.

N1 - Funding Information: This work is supported by Korea Telecom Research Center and by the KOSEF through the Science Research Center of Excellence Program.

PY - 1994/2

Y1 - 1994/2

N2 - Ferroelectric bismuth titanate thin films have been deposited on LaA103, SrTi03, MgO, Al2O3, and ZrO2/SiO2/Si substrates using a Q-switched Nd:YAG laser. X-ray diffraction studies show that most films on single crystal substrates have preferential crystallographic orientation. The film on MgO(11O) shows large electrooptic characteristics with an effective electrooptic coefficient of about 3.8xl0-15 m2/V2. Using a lens coupling method, it is demonstrated that light can propagate along the Bi4Ti3O12 layer in a Bi4Ti3O12/ZrO2/SiO2/Si(100) heterostructure.

AB - Ferroelectric bismuth titanate thin films have been deposited on LaA103, SrTi03, MgO, Al2O3, and ZrO2/SiO2/Si substrates using a Q-switched Nd:YAG laser. X-ray diffraction studies show that most films on single crystal substrates have preferential crystallographic orientation. The film on MgO(11O) shows large electrooptic characteristics with an effective electrooptic coefficient of about 3.8xl0-15 m2/V2. Using a lens coupling method, it is demonstrated that light can propagate along the Bi4Ti3O12 layer in a Bi4Ti3O12/ZrO2/SiO2/Si(100) heterostructure.

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DO - 10.1080/00150199408017610

M3 - Article

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VL - 152

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EP - 144

JO - Ferroelectrics

JF - Ferroelectrics

IS - 1

ER -

Studies on structural and electrooptic properties of ferroelectric bismuth titanate thin films

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