Structural properties of 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 relaxor ferroelectric thin films on SrRuO3 conducting oxides

Ji Hye Lee, Mi Ri Choi, William Jo, Ji Young Jang, Mi Young Kim

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Coating of 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 (PMN-PT) relaxor ferroelectrics by a sol-gel method is followed by growth of epitaxial SrRuO3 (SRO) metallic oxide electrodes on SrTiO3 (STO) single-crystal substrate by pulsed laser deposition. High-quality PMN-PT films on SRO with preferred growth orientation were successfully fabricated by controlling the operation parameters. Structural properties of relaxor ferroelectric PMN-PT thin films on SRO/STO substrates have been studied by X-ray diffraction (XRD), transmission electron microscopy (TEM) and atomic force microscopy (AFM). In-plane and out-of-plane alignments of the heterostructure are confirmed and the structural twinning of the materials are also revealed.

Original languageEnglish
Pages (from-to)1106-1109
Number of pages4
JournalUltramicroscopy
Volume108
Issue number10
DOIs
StatePublished - Sep 2008

Keywords

  • PMN-PT
  • Relaxor ferroelectrics
  • Scanning probe microscopy
  • TEM

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