Structural properties of 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 relaxor ferroelectric thin films on SrRuO3 conducting oxides

Ji Hye Lee; Mi Ri Choi; William Jo; Ji Young Jang; Mi Young Kim

doi:10.1016/j.ultramic.2008.04.020

Structural properties of 0.65Pb(Mg_1/3Nb_2/3)O₃-0.35PbTiO₃ relaxor ferroelectric thin films on SrRuO₃ conducting oxides

Ji Hye Lee, Mi Ri Choi, William Jo, Ji Young Jang, Mi Young Kim

Department of Physics

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

Coating of 0.65Pb(Mg_1/3Nb_2/3)O₃-0.35PbTiO₃ (PMN-PT) relaxor ferroelectrics by a sol-gel method is followed by growth of epitaxial SrRuO₃ (SRO) metallic oxide electrodes on SrTiO₃ (STO) single-crystal substrate by pulsed laser deposition. High-quality PMN-PT films on SRO with preferred growth orientation were successfully fabricated by controlling the operation parameters. Structural properties of relaxor ferroelectric PMN-PT thin films on SRO/STO substrates have been studied by X-ray diffraction (XRD), transmission electron microscopy (TEM) and atomic force microscopy (AFM). In-plane and out-of-plane alignments of the heterostructure are confirmed and the structural twinning of the materials are also revealed.

Original language	English
Pages (from-to)	1106-1109
Number of pages	4
Journal	Ultramicroscopy
Volume	108
Issue number	10
DOIs	https://doi.org/10.1016/j.ultramic.2008.04.020
State	Published - Sep 2008

Keywords

PMN-PT
Relaxor ferroelectrics
Scanning probe microscopy
TEM

Access to Document

10.1016/j.ultramic.2008.04.020

Cite this

@article{9a8685f2e94240799c9a56ed92711b4d,

title = "Structural properties of 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 relaxor ferroelectric thin films on SrRuO3 conducting oxides",

abstract = "Coating of 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 (PMN-PT) relaxor ferroelectrics by a sol-gel method is followed by growth of epitaxial SrRuO3 (SRO) metallic oxide electrodes on SrTiO3 (STO) single-crystal substrate by pulsed laser deposition. High-quality PMN-PT films on SRO with preferred growth orientation were successfully fabricated by controlling the operation parameters. Structural properties of relaxor ferroelectric PMN-PT thin films on SRO/STO substrates have been studied by X-ray diffraction (XRD), transmission electron microscopy (TEM) and atomic force microscopy (AFM). In-plane and out-of-plane alignments of the heterostructure are confirmed and the structural twinning of the materials are also revealed.",

keywords = "PMN-PT, Relaxor ferroelectrics, Scanning probe microscopy, TEM",

author = "Lee, {Ji Hye} and Choi, {Mi Ri} and William Jo and Jang, {Ji Young} and Kim, {Mi Young}",

year = "2008",

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doi = "10.1016/j.ultramic.2008.04.020",

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volume = "108",

pages = "1106--1109",

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TY - JOUR

T1 - Structural properties of 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 relaxor ferroelectric thin films on SrRuO3 conducting oxides

AU - Lee, Ji Hye

AU - Choi, Mi Ri

AU - Jo, William

AU - Jang, Ji Young

AU - Kim, Mi Young

PY - 2008/9

Y1 - 2008/9

N2 - Coating of 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 (PMN-PT) relaxor ferroelectrics by a sol-gel method is followed by growth of epitaxial SrRuO3 (SRO) metallic oxide electrodes on SrTiO3 (STO) single-crystal substrate by pulsed laser deposition. High-quality PMN-PT films on SRO with preferred growth orientation were successfully fabricated by controlling the operation parameters. Structural properties of relaxor ferroelectric PMN-PT thin films on SRO/STO substrates have been studied by X-ray diffraction (XRD), transmission electron microscopy (TEM) and atomic force microscopy (AFM). In-plane and out-of-plane alignments of the heterostructure are confirmed and the structural twinning of the materials are also revealed.

AB - Coating of 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 (PMN-PT) relaxor ferroelectrics by a sol-gel method is followed by growth of epitaxial SrRuO3 (SRO) metallic oxide electrodes on SrTiO3 (STO) single-crystal substrate by pulsed laser deposition. High-quality PMN-PT films on SRO with preferred growth orientation were successfully fabricated by controlling the operation parameters. Structural properties of relaxor ferroelectric PMN-PT thin films on SRO/STO substrates have been studied by X-ray diffraction (XRD), transmission electron microscopy (TEM) and atomic force microscopy (AFM). In-plane and out-of-plane alignments of the heterostructure are confirmed and the structural twinning of the materials are also revealed.

KW - PMN-PT

KW - Relaxor ferroelectrics

KW - Scanning probe microscopy

KW - TEM

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