Abstract
Cu 2ZnSnSe 4 thin-films are deposited with different sequential processes. The grain size and uniformity of the surfaces were different according to the process despite the final compositions are stoichiometric such as Cu poor and Zn rich measured by energy dispersive x-ray spectroscopy. X-ray diffraction studies reveal that the films have different secondary phases and preferred orientation depending on the process. The optical properties such as transmittance and reflectance indicate different ratio and wavelength. Local electrical properties using Kelvin prove force microscopy and conductive-atomic force microscopy yield the information of local surface potential and electrical transport.
| Original language | English |
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| Title of host publication | 2011 IEEE Nanotechnology Materials and Devices Conference, NMDC 2011 |
| Pages | 436-437 |
| Number of pages | 2 |
| DOIs | |
| State | Published - 2011 |
| Event | 2011 IEEE Nanotechnology Materials and Devices Conference, NMDC 2011 - Jeju, Korea, Republic of Duration: 18 Oct 2011 → 21 Oct 2011 |
Publication series
| Name | 2011 IEEE Nanotechnology Materials and Devices Conference, NMDC 2011 |
|---|
Conference
| Conference | 2011 IEEE Nanotechnology Materials and Devices Conference, NMDC 2011 |
|---|---|
| Country/Territory | Korea, Republic of |
| City | Jeju |
| Period | 18/10/11 → 21/10/11 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
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