Structural and optical properties of Cu 2ZnSnSe 4 thin-films for photovoltaic applications

A. R. Jeong, W. Jo, H. J. Jo, D. H. Kim, S. J. Sung, J. K. Kang, D. H. Lee

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Cu 2ZnSnSe 4 thin-films are deposited with different sequential processes. The grain size and uniformity of the surfaces were different according to the process despite the final compositions are stoichiometric such as Cu poor and Zn rich measured by energy dispersive x-ray spectroscopy. X-ray diffraction studies reveal that the films have different secondary phases and preferred orientation depending on the process. The optical properties such as transmittance and reflectance indicate different ratio and wavelength. Local electrical properties using Kelvin prove force microscopy and conductive-atomic force microscopy yield the information of local surface potential and electrical transport.

Original languageEnglish
Title of host publication2011 IEEE Nanotechnology Materials and Devices Conference, NMDC 2011
Pages436-437
Number of pages2
DOIs
StatePublished - 2011
Event2011 IEEE Nanotechnology Materials and Devices Conference, NMDC 2011 - Jeju, Korea, Republic of
Duration: 18 Oct 201121 Oct 2011

Publication series

Name2011 IEEE Nanotechnology Materials and Devices Conference, NMDC 2011

Conference

Conference2011 IEEE Nanotechnology Materials and Devices Conference, NMDC 2011
Country/TerritoryKorea, Republic of
CityJeju
Period18/10/1121/10/11

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