Structural and leakage current behavior of Bi4Ti3O12 thin films on La0.5Sr0.5CoO3 bottom electrodes grown by pulsed laser deposition

William Jo; K. H. Kim; T. W. Noh; S. D. Kwon; B. D. Choe; B. D. You

Structural and leakage current behavior of Bi₄Ti₃O₁₂ thin films on La_0.5Sr_0.5CoO₃ bottom electrodes grown by pulsed laser deposition

William Jo, K. H. Kim, T. W. Noh, S. D. Kwon, B. D. Choe, B. D. You

Department of Physics

Research output: Contribution to journal › Conference article › peer-review

3 Scopus citations

Abstract

Using La_0.5Sr_0.5CoO₃ bottom electrode layers, Bi₄Ti₃O₁₂ thin films were grown on LaAlO₃(001), Al₂O₃(0001), and Si(001) substrates. Crystalline orientation of the Bi₄Ti₃O₁₂ thin films was examined by x-ray diffraction techniques. The cross-sectional microstructures of Bi₄Ti₃O₁₂/La_0.5Sr_0.5CoO₃ heterostructures are investigated. It is found that the crystalline orientation and the microstructure affect leakage current behavior of the Bi₄Ti₃O₁₂ layers.

Original language	English
Pages (from-to)	33-38
Number of pages	6
Journal	Materials Research Society Symposium - Proceedings
Volume	361
State	Published - 1995
Event	Proceedings of the 1994 MRS Fall Meeting - Boston, MA, USA Duration: 29 Nov 1994 → 2 Dec 1994

Cite this

@article{17e499580f1f43349fc66797a3fb9c52,

title = "Structural and leakage current behavior of Bi4Ti3O12 thin films on La0.5Sr0.5CoO3 bottom electrodes grown by pulsed laser deposition",

abstract = "Using La0.5Sr0.5CoO3 bottom electrode layers, Bi4Ti3O12 thin films were grown on LaAlO3(001), Al2O3(0001), and Si(001) substrates. Crystalline orientation of the Bi4Ti3O12 thin films was examined by x-ray diffraction techniques. The cross-sectional microstructures of Bi4Ti3O12/La0.5Sr0.5CoO3 heterostructures are investigated. It is found that the crystalline orientation and the microstructure affect leakage current behavior of the Bi4Ti3O12 layers.",

author = "William Jo and Kim, {K. H.} and Noh, {T. W.} and Kwon, {S. D.} and Choe, {B. D.} and You, {B. D.}",

year = "1995",

language = "English",

volume = "361",

pages = "33--38",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

note = "Proceedings of the 1994 MRS Fall Meeting ; Conference date: 29-11-1994 Through 02-12-1994",

}

TY - JOUR

T1 - Structural and leakage current behavior of Bi4Ti3O12 thin films on La0.5Sr0.5CoO3 bottom electrodes grown by pulsed laser deposition

AU - Jo, William

AU - Kim, K. H.

AU - Noh, T. W.

AU - Kwon, S. D.

AU - Choe, B. D.

AU - You, B. D.

PY - 1995

Y1 - 1995

N2 - Using La0.5Sr0.5CoO3 bottom electrode layers, Bi4Ti3O12 thin films were grown on LaAlO3(001), Al2O3(0001), and Si(001) substrates. Crystalline orientation of the Bi4Ti3O12 thin films was examined by x-ray diffraction techniques. The cross-sectional microstructures of Bi4Ti3O12/La0.5Sr0.5CoO3 heterostructures are investigated. It is found that the crystalline orientation and the microstructure affect leakage current behavior of the Bi4Ti3O12 layers.

AB - Using La0.5Sr0.5CoO3 bottom electrode layers, Bi4Ti3O12 thin films were grown on LaAlO3(001), Al2O3(0001), and Si(001) substrates. Crystalline orientation of the Bi4Ti3O12 thin films was examined by x-ray diffraction techniques. The cross-sectional microstructures of Bi4Ti3O12/La0.5Sr0.5CoO3 heterostructures are investigated. It is found that the crystalline orientation and the microstructure affect leakage current behavior of the Bi4Ti3O12 layers.

UR - http://www.scopus.com/inward/record.url?scp=0029224446&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0029224446

SN - 0272-9172

VL - 361

SP - 33

EP - 38

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Proceedings of the 1994 MRS Fall Meeting

Y2 - 29 November 1994 through 2 December 1994

ER -

Structural and leakage current behavior of Bi4Ti3O12 thin films on La0.5Sr0.5CoO3 bottom electrodes grown by pulsed laser deposition

Abstract

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Structural and leakage current behavior of Bi₄Ti₃O₁₂ thin films on La_0.5Sr_0.5CoO₃ bottom electrodes grown by pulsed laser deposition