Structural and ferroelectric properties of Bi₄Ti₃O₁₂ thin films on IrO₂ prepared by rf magnetron sputtering

Engineering & Materials Science

• Bismuth 20%
• Crystallinity 18%
• Electric potential 7%
• Ferroelectric materials 99%
• Fluorescence 17%
• Magnetron sputtering 100%
• Microstructure 10%
• Oxygen 60%
• Polarization 27%
• Positive ions 18%
• Rutherford backscattering spectroscopy 27%
• Spectrometry 19%
• Sputtering 19%
• Structural properties 81%
• Substrates 10%
• Thin films 70%
• X ray photoelectron spectroscopy 18%
• X rays 13%

Chemical Compounds

• Cation 8%
• Chemistry 8%
• Crystallinity 11%
• Dioxygen 36%
• Fluorescence Spectrum 13%
• Liquid Film 21%
• Magnetron Sputtering 86%
• Microstructure 10%
• Polarization 22%
• Rutherford Backscattering Spectroscopy 19%
• Sputtering 16%
• Voltage 10%
• X-Ray Fluorescence 15%
• X-Ray Photoelectron Spectroscopy 10%