Structural and electrical properties of SrRuO₃ thin films for buffer layers of coated conductors

Engineering & Materials Science

• Buffer layers 100%
• Structural properties 76%
• Electric properties 74%
• Thin films 66%
• Growth temperature 37%
• Magnetoresistance 37%
• Ion beams 33%
• Substrates 33%
• Atomic force microscopy 29%
• Grain growth 29%
• Partial pressure 27%
• Single crystals 26%
• Surface morphology 26%
• X ray diffraction 23%
• Oxygen 18%
• Temperature 18%
• Scanning electron microscopy 18%
• Lasers 17%
• Metals 15%

Physics & Astronomy

• buffers 59%
• conductors 57%
• electrical properties 51%
• thin films 36%
• partial pressure 22%
• templates 21%
• temperature 20%
• repetition 19%
• ion beams 18%
• atomic force microscopy 17%
• scanning electron microscopy 15%
• electrical resistivity 14%
• single crystals 14%
• oxygen 14%
• diffraction 12%
• metals 11%
• x rays 10%
• lasers 10%

Chemical Compounds

• Conductor 70%
• Electrical Property 58%
• Buffer Solution 45%
• Magnetoresistance 32%
• Grain Growth 28%
• Ion Beam 25%
• Partial Pressure 22%
• Atomic Force Microscopy 18%
• Single Crystalline Solid 16%
• Scanning Electron Microscopy 13%
• Pressure 13%
• X-Ray Diffraction 11%
• Dioxygen 11%
• Liquid Film 11%
• Metal 10%
• Surface 7%