Structural and electrical properties of SrRuO3 thin films for buffer layers of coated conductors

M. R. Choi; W. Jo; Y. S. Oh; K. H. Kim; Y. M. Kang; S. I. Yoo; S. H. Moon; H. S. Ha; S. S. Oh

doi:10.1016/j.physc.2007.05.024

Structural and electrical properties of SrRuO₃ thin films for buffer layers of coated conductors

M. R. Choi, W. Jo, Y. S. Oh, K. H. Kim, Y. M. Kang, S. I. Yoo, S. H. Moon, H. S. Ha, S. S. Oh

Department of Physics

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

SrRuO₃ thin films have been grown in situ on single crystal LaAlO₃ substrates and textured metal templates which contain an MgO layer produced by an ion-beam growth method. Deposition was made of oxygen partial pressure in a range from 50 m Torr to 250 m Torr with laser repetition rate of 5 Hz. Substrate temperature was between 600 °C and 800 °C. Dependence of out-of-plane and in-plane orientation of SrRuO₃ thin films on pressure and growth temperature was investigated by X-ray diffraction. The surface morphology and grain growth behaviors of SrRuO₃ thin films were analyzed by atomic force microscopy and scanning electron microscopy. In addition, the transverse magnetoresistance value in a field of 4 and 8 T was measured in temperature range of 50-200 K and the ferromagnetic transition at ∼140 K of SrRuO₃ films on LaAlO₃ was detected by resistivity measurement.

Original language	English
Pages (from-to)	584-588
Number of pages	5
Journal	Physica C: Superconductivity and its Applications
Volume	463-465
Issue number	SUPPL.
DOIs	https://doi.org/10.1016/j.physc.2007.05.024
State	Published - 1 Oct 2007

Bibliographical note

Funding Information:
This work was supported by support from center for applied superconductivity technology of the 21st century frontier R&D program funded by the Ministry of Science and Technology. One of the authors (KHK) is supported by the National Research Laboratory program (M10600000238) by the Korean Ministry of Science and Technology.

Keywords

Coated conductors
Pulsed laser deposition
SrRuO buffer layers

Access to Document

10.1016/j.physc.2007.05.024

Cite this

@article{10b87279496e4d0d9362237c72c1f649,

title = "Structural and electrical properties of SrRuO3 thin films for buffer layers of coated conductors",

abstract = "SrRuO3 thin films have been grown in situ on single crystal LaAlO3 substrates and textured metal templates which contain an MgO layer produced by an ion-beam growth method. Deposition was made of oxygen partial pressure in a range from 50 m Torr to 250 m Torr with laser repetition rate of 5 Hz. Substrate temperature was between 600 °C and 800 °C. Dependence of out-of-plane and in-plane orientation of SrRuO3 thin films on pressure and growth temperature was investigated by X-ray diffraction. The surface morphology and grain growth behaviors of SrRuO3 thin films were analyzed by atomic force microscopy and scanning electron microscopy. In addition, the transverse magnetoresistance value in a field of 4 and 8 T was measured in temperature range of 50-200 K and the ferromagnetic transition at ∼140 K of SrRuO3 films on LaAlO3 was detected by resistivity measurement.",

keywords = "Coated conductors, Pulsed laser deposition, SrRuO buffer layers",

author = "Choi, {M. R.} and W. Jo and Oh, {Y. S.} and Kim, {K. H.} and Kang, {Y. M.} and Yoo, {S. I.} and Moon, {S. H.} and Ha, {H. S.} and Oh, {S. S.}",

note = "Funding Information: This work was supported by support from center for applied superconductivity technology of the 21st century frontier R&D program funded by the Ministry of Science and Technology. One of the authors (KHK) is supported by the National Research Laboratory program (M10600000238) by the Korean Ministry of Science and Technology.",

year = "2007",

month = oct,

day = "1",

doi = "10.1016/j.physc.2007.05.024",

language = "English",

volume = "463-465",

pages = "584--588",

journal = "Physica C: Superconductivity and its Applications",

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T1 - Structural and electrical properties of SrRuO3 thin films for buffer layers of coated conductors

AU - Choi, M. R.

AU - Jo, W.

AU - Oh, Y. S.

AU - Kim, K. H.

AU - Kang, Y. M.

AU - Yoo, S. I.

AU - Moon, S. H.

AU - Ha, H. S.

AU - Oh, S. S.

N1 - Funding Information: This work was supported by support from center for applied superconductivity technology of the 21st century frontier R&D program funded by the Ministry of Science and Technology. One of the authors (KHK) is supported by the National Research Laboratory program (M10600000238) by the Korean Ministry of Science and Technology.

PY - 2007/10/1

Y1 - 2007/10/1

N2 - SrRuO3 thin films have been grown in situ on single crystal LaAlO3 substrates and textured metal templates which contain an MgO layer produced by an ion-beam growth method. Deposition was made of oxygen partial pressure in a range from 50 m Torr to 250 m Torr with laser repetition rate of 5 Hz. Substrate temperature was between 600 °C and 800 °C. Dependence of out-of-plane and in-plane orientation of SrRuO3 thin films on pressure and growth temperature was investigated by X-ray diffraction. The surface morphology and grain growth behaviors of SrRuO3 thin films were analyzed by atomic force microscopy and scanning electron microscopy. In addition, the transverse magnetoresistance value in a field of 4 and 8 T was measured in temperature range of 50-200 K and the ferromagnetic transition at ∼140 K of SrRuO3 films on LaAlO3 was detected by resistivity measurement.

AB - SrRuO3 thin films have been grown in situ on single crystal LaAlO3 substrates and textured metal templates which contain an MgO layer produced by an ion-beam growth method. Deposition was made of oxygen partial pressure in a range from 50 m Torr to 250 m Torr with laser repetition rate of 5 Hz. Substrate temperature was between 600 °C and 800 °C. Dependence of out-of-plane and in-plane orientation of SrRuO3 thin films on pressure and growth temperature was investigated by X-ray diffraction. The surface morphology and grain growth behaviors of SrRuO3 thin films were analyzed by atomic force microscopy and scanning electron microscopy. In addition, the transverse magnetoresistance value in a field of 4 and 8 T was measured in temperature range of 50-200 K and the ferromagnetic transition at ∼140 K of SrRuO3 films on LaAlO3 was detected by resistivity measurement.

KW - Coated conductors

KW - Pulsed laser deposition

KW - SrRuO buffer layers

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