Stability of metal-oxygen octahedra in Bi-layered perovskite materials

Bae Ho Park; Sang Jin Hyun; Sang Don Bu; Tae Won Noh; Jae Chan Lee; Hyung Do Kim; Tae Hyung Kim; William Jo

Stability of metal-oxygen octahedra in Bi-layered perovskite materials

Bae Ho Park
, Sang Jin Hyun
, Sang Don Bu
, Tae Won Noh
, Jae Chan Lee
, Hyung Do Kim
, Tae Hyung Kim
, William Jo

Department of Physics

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

It is well known that defect charges present at metal-oxygen octahedra of ferroelectric materials are related to ferroelectric reliability problems, such as fatigue failures. In order to investigate stability of metal-oxygen octahedra, we performed X-ray photoemission spectroscopy measurements on SrBi₂Ta₂O₉ (SET) and Bi₄Ti₃O₁₂ (BTO) films. For the SBT film, it was found that the oxygen ions at the metal-oxygen octahedra were much more stable than those at the (Bi₂O₂)²⁺ layers. On the other hand, for the BTO film, the metal-oxygen octahedra had nearly the same instability as the (Bi₂O₂)²⁺ layers. We suggest that the difference in stability of the metal-oxygen octahedra is related to the difference between the fatigue-free behaviors in the SBT and the BTO films.

Original language	English
Pages (from-to)	S100-S103
Journal	Journal of the Korean Physical Society
Volume	35
Issue number	SUPPL. 2
State	Published - 1999

Cite this

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title = "Stability of metal-oxygen octahedra in Bi-layered perovskite materials",

abstract = "It is well known that defect charges present at metal-oxygen octahedra of ferroelectric materials are related to ferroelectric reliability problems, such as fatigue failures. In order to investigate stability of metal-oxygen octahedra, we performed X-ray photoemission spectroscopy measurements on SrBi2Ta2O9 (SET) and Bi4Ti3O12 (BTO) films. For the SBT film, it was found that the oxygen ions at the metal-oxygen octahedra were much more stable than those at the (Bi2O2)2+ layers. On the other hand, for the BTO film, the metal-oxygen octahedra had nearly the same instability as the (Bi2O2)2+ layers. We suggest that the difference in stability of the metal-oxygen octahedra is related to the difference between the fatigue-free behaviors in the SBT and the BTO films.",

author = "Park, \{Bae Ho\} and Hyun, \{Sang Jin\} and Bu, \{Sang Don\} and Noh, \{Tae Won\} and Lee, \{Jae Chan\} and Kim, \{Hyung Do\} and Kim, \{Tae Hyung\} and William Jo",

year = "1999",

language = "English",

volume = "35",

pages = "S100--S103",

journal = "Journal of the Korean Physical Society",

issn = "0374-4884",

publisher = "Korean Physical Society",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Stability of metal-oxygen octahedra in Bi-layered perovskite materials

AU - Park, Bae Ho

AU - Hyun, Sang Jin

AU - Bu, Sang Don

AU - Noh, Tae Won

AU - Lee, Jae Chan

AU - Kim, Hyung Do

AU - Kim, Tae Hyung

AU - Jo, William

PY - 1999

Y1 - 1999

N2 - It is well known that defect charges present at metal-oxygen octahedra of ferroelectric materials are related to ferroelectric reliability problems, such as fatigue failures. In order to investigate stability of metal-oxygen octahedra, we performed X-ray photoemission spectroscopy measurements on SrBi2Ta2O9 (SET) and Bi4Ti3O12 (BTO) films. For the SBT film, it was found that the oxygen ions at the metal-oxygen octahedra were much more stable than those at the (Bi2O2)2+ layers. On the other hand, for the BTO film, the metal-oxygen octahedra had nearly the same instability as the (Bi2O2)2+ layers. We suggest that the difference in stability of the metal-oxygen octahedra is related to the difference between the fatigue-free behaviors in the SBT and the BTO films.

AB - It is well known that defect charges present at metal-oxygen octahedra of ferroelectric materials are related to ferroelectric reliability problems, such as fatigue failures. In order to investigate stability of metal-oxygen octahedra, we performed X-ray photoemission spectroscopy measurements on SrBi2Ta2O9 (SET) and Bi4Ti3O12 (BTO) films. For the SBT film, it was found that the oxygen ions at the metal-oxygen octahedra were much more stable than those at the (Bi2O2)2+ layers. On the other hand, for the BTO film, the metal-oxygen octahedra had nearly the same instability as the (Bi2O2)2+ layers. We suggest that the difference in stability of the metal-oxygen octahedra is related to the difference between the fatigue-free behaviors in the SBT and the BTO films.

UR - https://www.scopus.com/pages/publications/0033470052

M3 - Article

AN - SCOPUS:0033470052

SN - 0374-4884

VL - 35

SP - S100-S103

JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

IS - SUPPL. 2

ER -

Stability of metal-oxygen octahedra in Bi-layered perovskite materials

Abstract

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