Stability of metal-oxygen octahedra in Bi-layered perovskite materials

Bae Ho Park; Sang Jin Hyun; Sang Don Bu; Tae Won Noh; Jae Chan Lee; Hyung Do Kim; Tae Hyung Kim; William Jo

Stability of metal-oxygen octahedra in Bi-layered perovskite materials

Bae Ho Park, Sang Jin Hyun, Sang Don Bu, Tae Won Noh, Jae Chan Lee, Hyung Do Kim, Tae Hyung Kim, William Jo

Department of Physics

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

It is well known that defect charges present at metal-oxygen octahedra of ferroelectric materials are related to ferroelectric reliability problems, such as fatigue failures. In order to investigate stability of metal-oxygen octahedra, we performed X-ray photoemission spectroscopy measurements on SrBi₂Ta₂O₉ (SET) and Bi₄Ti₃O₁₂ (BTO) films. For the SBT film, it was found that the oxygen ions at the metal-oxygen octahedra were much more stable than those at the (Bi₂O₂)²⁺ layers. On the other hand, for the BTO film, the metal-oxygen octahedra had nearly the same instability as the (Bi₂O₂)²⁺ layers. We suggest that the difference in stability of the metal-oxygen octahedra is related to the difference between the fatigue-free behaviors in the SBT and the BTO films.

Original language	English
Pages (from-to)	S100-S103
Journal	Journal of the Korean Physical Society
Volume	35
Issue number	SUPPL. 2
State	Published - 1999

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title = "Stability of metal-oxygen octahedra in Bi-layered perovskite materials",

abstract = "It is well known that defect charges present at metal-oxygen octahedra of ferroelectric materials are related to ferroelectric reliability problems, such as fatigue failures. In order to investigate stability of metal-oxygen octahedra, we performed X-ray photoemission spectroscopy measurements on SrBi2Ta2O9 (SET) and Bi4Ti3O12 (BTO) films. For the SBT film, it was found that the oxygen ions at the metal-oxygen octahedra were much more stable than those at the (Bi2O2)2+ layers. On the other hand, for the BTO film, the metal-oxygen octahedra had nearly the same instability as the (Bi2O2)2+ layers. We suggest that the difference in stability of the metal-oxygen octahedra is related to the difference between the fatigue-free behaviors in the SBT and the BTO films.",

author = "Park, {Bae Ho} and Hyun, {Sang Jin} and Bu, {Sang Don} and Noh, {Tae Won} and Lee, {Jae Chan} and Kim, {Hyung Do} and Kim, {Tae Hyung} and William Jo",

year = "1999",

language = "English",

volume = "35",

pages = "S100--S103",

journal = "Journal of the Korean Physical Society",

issn = "0374-4884",

publisher = "Korean Physical Society",

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}

TY - JOUR

T1 - Stability of metal-oxygen octahedra in Bi-layered perovskite materials

AU - Park, Bae Ho

AU - Hyun, Sang Jin

AU - Bu, Sang Don

AU - Noh, Tae Won

AU - Lee, Jae Chan

AU - Kim, Hyung Do

AU - Kim, Tae Hyung

AU - Jo, William

PY - 1999

Y1 - 1999

N2 - It is well known that defect charges present at metal-oxygen octahedra of ferroelectric materials are related to ferroelectric reliability problems, such as fatigue failures. In order to investigate stability of metal-oxygen octahedra, we performed X-ray photoemission spectroscopy measurements on SrBi2Ta2O9 (SET) and Bi4Ti3O12 (BTO) films. For the SBT film, it was found that the oxygen ions at the metal-oxygen octahedra were much more stable than those at the (Bi2O2)2+ layers. On the other hand, for the BTO film, the metal-oxygen octahedra had nearly the same instability as the (Bi2O2)2+ layers. We suggest that the difference in stability of the metal-oxygen octahedra is related to the difference between the fatigue-free behaviors in the SBT and the BTO films.

AB - It is well known that defect charges present at metal-oxygen octahedra of ferroelectric materials are related to ferroelectric reliability problems, such as fatigue failures. In order to investigate stability of metal-oxygen octahedra, we performed X-ray photoemission spectroscopy measurements on SrBi2Ta2O9 (SET) and Bi4Ti3O12 (BTO) films. For the SBT film, it was found that the oxygen ions at the metal-oxygen octahedra were much more stable than those at the (Bi2O2)2+ layers. On the other hand, for the BTO film, the metal-oxygen octahedra had nearly the same instability as the (Bi2O2)2+ layers. We suggest that the difference in stability of the metal-oxygen octahedra is related to the difference between the fatigue-free behaviors in the SBT and the BTO films.

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M3 - Article

AN - SCOPUS:0033470052

SN - 0374-4884

VL - 35

SP - S100-S103

JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

IS - SUPPL. 2

ER -

Stability of metal-oxygen octahedra in Bi-layered perovskite materials

Abstract

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