Software Testing Techniques for Safety-Critical Embedded Software

Ah Young Sung; Byoung Ju Choi

Software Testing Techniques for Safety-Critical Embedded Software

Ah Young Sung, Byoung Ju Choi

Department of Computer Science & Engineering

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	197
Number of pages	1
Journal	Transactions of the American Nuclear Society
Volume	89
State	Published - 2003
Event	International Conference on Nuclear Technology: Achieving Global Economic Growth While Safeguarding the Environment - New Orleans, LO, United States Duration: 16 Nov 2003 → 20 Nov 2003

Cite this

@article{6e52663c84cd4ba99b89f72a4bf245ab,

title = "Software Testing Techniques for Safety-Critical Embedded Software",

author = "Sung, \{Ah Young\} and Choi, \{Byoung Ju\}",

year = "2003",

language = "English",

volume = "89",

pages = "197",

journal = "Transactions of the American Nuclear Society",

issn = "0003-018X",

publisher = "American Nuclear Society",

note = "International Conference on Nuclear Technology: Achieving Global Economic Growth While Safeguarding the Environment ; Conference date: 16-11-2003 Through 20-11-2003",

}

TY - JOUR

T1 - Software Testing Techniques for Safety-Critical Embedded Software

AU - Sung, Ah Young

AU - Choi, Byoung Ju

PY - 2003

Y1 - 2003

UR - https://www.scopus.com/pages/publications/0346274039

M3 - Conference article

AN - SCOPUS:0346274039

SN - 0003-018X

VL - 89

SP - 197

JO - Transactions of the American Nuclear Society

JF - Transactions of the American Nuclear Society

T2 - International Conference on Nuclear Technology: Achieving Global Economic Growth While Safeguarding the Environment

Y2 - 16 November 2003 through 20 November 2003

ER -