Single-ion fluorescence probing of electro-optic modulator efficiency and Raman coupling in trapped-ion system

Hyerin Kim; Jieun Yoo; Yeongseo Kim; Hyunsoo Kim; Yerin Go; Dahyun Yum; Taeyoung Choi

doi:10.1016/j.cap.2025.11.017

Single-ion fluorescence probing of electro-optic modulator efficiency and Raman coupling in trapped-ion system

Hyerin Kim
, Jieun Yoo
, Yeongseo Kim
, Hyunsoo Kim
, Yerin Go
, Dahyun Yum
, Taeyoung Choi

Department of Physics

Research output: Contribution to journal › Article › peer-review

Abstract

We present a fluorescence-based method for optimizing electro-optic modulator (EOM) performance using a single trapped ion. By comparing fluorescence from a trapped ion with optical cavity measurements, we determine modulation conditions for optimizing optical sidebands, which is essential for driving various transitions relevant to ion-qubit manipulation. We also observe enhanced fluorescence from a trapped ion when applying high-power pulsed laser without EOM modulation. Since the pulsed laser is used for performing quantum gates on individual ions, this fluorescence signal can serve as a diagnostic tool for aligning the ion with a tightly focused laser beam. These results provide a practical method for optimizing sideband generation and diagnosing spatial beam overlap in trapped-ion quantum systems.

Original language	English
Pages (from-to)	53-58
Number of pages	6
Journal	Current Applied Physics
Volume	83
DOIs	https://doi.org/10.1016/j.cap.2025.11.017
State	Published - Feb 2026

Bibliographical note

Publisher Copyright:
© 2025 Korean Physical Society

Keywords

171 Yb+ ions
Electro-optic modulator optimization
Ion fluorescence probing
Trapped-ion quantum computing

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10.1016/j.cap.2025.11.017

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title = "Single-ion fluorescence probing of electro-optic modulator efficiency and Raman coupling in trapped-ion system",

abstract = "We present a fluorescence-based method for optimizing electro-optic modulator (EOM) performance using a single trapped ion. By comparing fluorescence from a trapped ion with optical cavity measurements, we determine modulation conditions for optimizing optical sidebands, which is essential for driving various transitions relevant to ion-qubit manipulation. We also observe enhanced fluorescence from a trapped ion when applying high-power pulsed laser without EOM modulation. Since the pulsed laser is used for performing quantum gates on individual ions, this fluorescence signal can serve as a diagnostic tool for aligning the ion with a tightly focused laser beam. These results provide a practical method for optimizing sideband generation and diagnosing spatial beam overlap in trapped-ion quantum systems.",

keywords = "171 Yb+ ions, Electro-optic modulator optimization, Ion fluorescence probing, Trapped-ion quantum computing",

author = "Hyerin Kim and Jieun Yoo and Yeongseo Kim and Hyunsoo Kim and Yerin Go and Dahyun Yum and Taeyoung Choi",

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doi = "10.1016/j.cap.2025.11.017",

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T1 - Single-ion fluorescence probing of electro-optic modulator efficiency and Raman coupling in trapped-ion system

AU - Kim, Hyerin

AU - Yoo, Jieun

AU - Kim, Yeongseo

AU - Kim, Hyunsoo

AU - Go, Yerin

AU - Yum, Dahyun

AU - Choi, Taeyoung

PY - 2026/2

Y1 - 2026/2

N2 - We present a fluorescence-based method for optimizing electro-optic modulator (EOM) performance using a single trapped ion. By comparing fluorescence from a trapped ion with optical cavity measurements, we determine modulation conditions for optimizing optical sidebands, which is essential for driving various transitions relevant to ion-qubit manipulation. We also observe enhanced fluorescence from a trapped ion when applying high-power pulsed laser without EOM modulation. Since the pulsed laser is used for performing quantum gates on individual ions, this fluorescence signal can serve as a diagnostic tool for aligning the ion with a tightly focused laser beam. These results provide a practical method for optimizing sideband generation and diagnosing spatial beam overlap in trapped-ion quantum systems.

AB - We present a fluorescence-based method for optimizing electro-optic modulator (EOM) performance using a single trapped ion. By comparing fluorescence from a trapped ion with optical cavity measurements, we determine modulation conditions for optimizing optical sidebands, which is essential for driving various transitions relevant to ion-qubit manipulation. We also observe enhanced fluorescence from a trapped ion when applying high-power pulsed laser without EOM modulation. Since the pulsed laser is used for performing quantum gates on individual ions, this fluorescence signal can serve as a diagnostic tool for aligning the ion with a tightly focused laser beam. These results provide a practical method for optimizing sideband generation and diagnosing spatial beam overlap in trapped-ion quantum systems.

KW - 171 Yb+ ions

KW - Electro-optic modulator optimization

KW - Ion fluorescence probing

KW - Trapped-ion quantum computing

UR - https://www.scopus.com/pages/publications/105024319065

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DO - 10.1016/j.cap.2025.11.017

M3 - Article

AN - SCOPUS:105024319065

SN - 1567-1739

VL - 83

SP - 53

EP - 58

JO - Current Applied Physics

JF - Current Applied Physics

ER -

Single-ion fluorescence probing of electro-optic modulator efficiency and Raman coupling in trapped-ion system

Abstract

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Keywords

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