Simultaneous imaging of ionic conductivity and morphology of a microfluidic system

Cristian Ionescu-Zanetti; Karen Cheung; Ratneshwar Lal; Luke P. Lee

doi:10.1063/1.1576297

Simultaneous imaging of ionic conductivity and morphology of a microfluidic system

Cristian Ionescu-Zanetti, Karen Cheung, Ratneshwar Lal, Luke P. Lee

Department of Chemistry & Nanoscience

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

A study was performed on the simultaneous imaging of ionic conductivity and morphology of a microfluidic system. Atomic force microscopy (AFM) was used to image the device morphology and the AFM tip was used as an electrode probe to measure the conductivity through a buffer in the fluidic channels to a reference electrode. The connectivity to a reference electrode was probed at a large number of test points without the requirement of external fluidic connections.

Original language	English
Pages (from-to)	10134-10136
Number of pages	3
Journal	Journal of Applied Physics
Volume	93
Issue number	12
DOIs	https://doi.org/10.1063/1.1576297
State	Published - 15 Jun 2003

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title = "Simultaneous imaging of ionic conductivity and morphology of a microfluidic system",

abstract = "A study was performed on the simultaneous imaging of ionic conductivity and morphology of a microfluidic system. Atomic force microscopy (AFM) was used to image the device morphology and the AFM tip was used as an electrode probe to measure the conductivity through a buffer in the fluidic channels to a reference electrode. The connectivity to a reference electrode was probed at a large number of test points without the requirement of external fluidic connections.",

author = "Cristian Ionescu-Zanetti and Karen Cheung and Ratneshwar Lal and Lee, \{Luke P.\}",

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AU - Cheung, Karen

AU - Lal, Ratneshwar

AU - Lee, Luke P.

PY - 2003/6/15

Y1 - 2003/6/15

N2 - A study was performed on the simultaneous imaging of ionic conductivity and morphology of a microfluidic system. Atomic force microscopy (AFM) was used to image the device morphology and the AFM tip was used as an electrode probe to measure the conductivity through a buffer in the fluidic channels to a reference electrode. The connectivity to a reference electrode was probed at a large number of test points without the requirement of external fluidic connections.

AB - A study was performed on the simultaneous imaging of ionic conductivity and morphology of a microfluidic system. Atomic force microscopy (AFM) was used to image the device morphology and the AFM tip was used as an electrode probe to measure the conductivity through a buffer in the fluidic channels to a reference electrode. The connectivity to a reference electrode was probed at a large number of test points without the requirement of external fluidic connections.

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M3 - Article

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EP - 10136

JO - Journal of Applied Physics

JF - Journal of Applied Physics

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Simultaneous imaging of ionic conductivity and morphology of a microfluidic system

Abstract

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