Simultaneous imaging of ionic conductivity and morphology of a microfluidic system

Cristian Ionescu-Zanetti, Karen Cheung, Ratneshwar Lal, Luke P. Lee

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

A study was performed on the simultaneous imaging of ionic conductivity and morphology of a microfluidic system. Atomic force microscopy (AFM) was used to image the device morphology and the AFM tip was used as an electrode probe to measure the conductivity through a buffer in the fluidic channels to a reference electrode. The connectivity to a reference electrode was probed at a large number of test points without the requirement of external fluidic connections.

Original languageEnglish
Pages (from-to)10134-10136
Number of pages3
JournalJournal of Applied Physics
Volume93
Issue number12
DOIs
StatePublished - 15 Jun 2003

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