Abstract
A study was performed on the simultaneous imaging of ionic conductivity and morphology of a microfluidic system. Atomic force microscopy (AFM) was used to image the device morphology and the AFM tip was used as an electrode probe to measure the conductivity through a buffer in the fluidic channels to a reference electrode. The connectivity to a reference electrode was probed at a large number of test points without the requirement of external fluidic connections.
Original language | English |
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Pages (from-to) | 10134-10136 |
Number of pages | 3 |
Journal | Journal of Applied Physics |
Volume | 93 |
Issue number | 12 |
DOIs | |
State | Published - 15 Jun 2003 |