TY - GEN
T1 - Silicon-embedded 3D toroidal air-core inductor with through-wafer interconnect for on-chip integration
AU - Yu, Xuehong
AU - Kim, Minsoo
AU - Herrault, Florian
AU - Ji, Chang Hyeon
AU - Kim, Jungkwun
AU - Allen, Mark G.
PY - 2012
Y1 - 2012
N2 - This paper presents a CMOS-compatible process for fabrication of 3D structures embedded in the volume of a silicon wafer, and capable of interconnection to circuitry on the wafer surface. The key challenge of embedding structures in the silicon substrate is processing inside deep silicon trenches. This difficulty is overcome by means of several key techniques: multilevel wafer etching; cavity shaping; fine proximity lithography at the bottom of trenches; and laminated dry-film lithography on complex 3D structures. As a technology demonstration, a topologically complex 3D toroidal inductor is fabricated in a deep silicon trench, and is coupled to the wafer surface with high-power, electroplated through-wafer interconnect. Inductors fabricated in these trenches achieved an overall inductance of 60 nH, dc resistance of 399 MΩ, and quality factor of 17.5 at 70 MHz.
AB - This paper presents a CMOS-compatible process for fabrication of 3D structures embedded in the volume of a silicon wafer, and capable of interconnection to circuitry on the wafer surface. The key challenge of embedding structures in the silicon substrate is processing inside deep silicon trenches. This difficulty is overcome by means of several key techniques: multilevel wafer etching; cavity shaping; fine proximity lithography at the bottom of trenches; and laminated dry-film lithography on complex 3D structures. As a technology demonstration, a topologically complex 3D toroidal inductor is fabricated in a deep silicon trench, and is coupled to the wafer surface with high-power, electroplated through-wafer interconnect. Inductors fabricated in these trenches achieved an overall inductance of 60 nH, dc resistance of 399 MΩ, and quality factor of 17.5 at 70 MHz.
UR - http://www.scopus.com/inward/record.url?scp=84860490360&partnerID=8YFLogxK
U2 - 10.1109/MEMSYS.2012.6170201
DO - 10.1109/MEMSYS.2012.6170201
M3 - Conference contribution
AN - SCOPUS:84860490360
SN - 9781467303248
T3 - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
SP - 325
EP - 328
BT - 2012 IEEE 25th International Conference on Micro Electro Mechanical Systems, MEMS 2012
T2 - 2012 IEEE 25th International Conference on Micro Electro Mechanical Systems, MEMS 2012
Y2 - 29 January 2012 through 2 February 2012
ER -