Scanning force microscopy of relaxor ferroelectric PbMg 1/3Nb2/3O3-PbTiO3 thin films for piezoelectric sensors

J. H. Lee; T. Y. Kim; Y. J. Oh; M. R. Choi; H. R. Yoon; W. Jo; H. J. Nam

Scanning force microscopy of relaxor ferroelectric PbMg _1/3Nb_2/3O₃-PbTiO₃ thin films for piezoelectric sensors

J. H. Lee, T. Y. Kim, Y. J. Oh, M. R. Choi, H. R. Yoon, W. Jo, H. J. Nam

Department of Physics

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

Relaxor ferroelectric PbMg_1/3Nb_2/3O ₃-PbTiO₃ (PMN-PT) thin films were grown by a sol-gel method. By using scanning force microscopy, piezoelectric poling and imaging were studied in a number of regions on the films with subsequent statistical analysis of the obtained data. Piezoresponse and poling behavior appear to have a relation with relaxor behavior of the materials, which is defined as frequency-dependent phase transition in ferroelectric materials. Hysteresis loops are observed when an external field is swept, regardless of vibration frequency of the bias, indicating relaxation behavior of the PMN-PT films.

Original language	English
Pages (from-to)	S833-S836
Journal	Journal of the Korean Physical Society
Volume	49
Issue number	SUPPL. 3
State	Published - Dec 2006

Keywords

PMN-PT
Piezoelectric
Relaxor ferroelectric
Scanning force microscopy

Cite this

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title = "Scanning force microscopy of relaxor ferroelectric PbMg 1/3Nb2/3O3-PbTiO3 thin films for piezoelectric sensors",

abstract = "Relaxor ferroelectric PbMg1/3Nb2/3O 3-PbTiO3 (PMN-PT) thin films were grown by a sol-gel method. By using scanning force microscopy, piezoelectric poling and imaging were studied in a number of regions on the films with subsequent statistical analysis of the obtained data. Piezoresponse and poling behavior appear to have a relation with relaxor behavior of the materials, which is defined as frequency-dependent phase transition in ferroelectric materials. Hysteresis loops are observed when an external field is swept, regardless of vibration frequency of the bias, indicating relaxation behavior of the PMN-PT films.",

keywords = "PMN-PT, Piezoelectric, Relaxor ferroelectric, Scanning force microscopy",

author = "Lee, \{J. H.\} and Kim, \{T. Y.\} and Oh, \{Y. J.\} and Choi, \{M. R.\} and Yoon, \{H. R.\} and W. Jo and Nam, \{H. J.\}",

year = "2006",

month = dec,

language = "English",

volume = "49",

pages = "S833--S836",

journal = "Journal of the Korean Physical Society",

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publisher = "Korean Physical Society",

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TY - JOUR

T1 - Scanning force microscopy of relaxor ferroelectric PbMg 1/3Nb2/3O3-PbTiO3 thin films for piezoelectric sensors

AU - Lee, J. H.

AU - Kim, T. Y.

AU - Oh, Y. J.

AU - Choi, M. R.

AU - Yoon, H. R.

AU - Jo, W.

AU - Nam, H. J.

PY - 2006/12

Y1 - 2006/12

N2 - Relaxor ferroelectric PbMg1/3Nb2/3O 3-PbTiO3 (PMN-PT) thin films were grown by a sol-gel method. By using scanning force microscopy, piezoelectric poling and imaging were studied in a number of regions on the films with subsequent statistical analysis of the obtained data. Piezoresponse and poling behavior appear to have a relation with relaxor behavior of the materials, which is defined as frequency-dependent phase transition in ferroelectric materials. Hysteresis loops are observed when an external field is swept, regardless of vibration frequency of the bias, indicating relaxation behavior of the PMN-PT films.

AB - Relaxor ferroelectric PbMg1/3Nb2/3O 3-PbTiO3 (PMN-PT) thin films were grown by a sol-gel method. By using scanning force microscopy, piezoelectric poling and imaging were studied in a number of regions on the films with subsequent statistical analysis of the obtained data. Piezoresponse and poling behavior appear to have a relation with relaxor behavior of the materials, which is defined as frequency-dependent phase transition in ferroelectric materials. Hysteresis loops are observed when an external field is swept, regardless of vibration frequency of the bias, indicating relaxation behavior of the PMN-PT films.

KW - PMN-PT

KW - Piezoelectric

KW - Relaxor ferroelectric

KW - Scanning force microscopy

UR - https://www.scopus.com/pages/publications/33846459044

M3 - Article

AN - SCOPUS:33846459044

SN - 0374-4884

VL - 49

SP - S833-S836

JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

IS - SUPPL. 3

ER -

Scanning force microscopy of relaxor ferroelectric PbMg 1/3Nb2/3O3-PbTiO3 thin films for piezoelectric sensors

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Keywords

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Scanning force microscopy of relaxor ferroelectric PbMg _1/3Nb_2/3O₃-PbTiO₃ thin films for piezoelectric sensors