Scanning force microscopy of relaxor ferroelectric PbMg 1/3Nb2/3O3-PbTiO3 thin films for piezoelectric sensors

J. H. Lee, T. Y. Kim, Y. J. Oh, M. R. Choi, H. R. Yoon, W. Jo, H. J. Nam

Research output: Contribution to journalArticlepeer-review

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Abstract

Relaxor ferroelectric PbMg1/3Nb2/3O 3-PbTiO3 (PMN-PT) thin films were grown by a sol-gel method. By using scanning force microscopy, piezoelectric poling and imaging were studied in a number of regions on the films with subsequent statistical analysis of the obtained data. Piezoresponse and poling behavior appear to have a relation with relaxor behavior of the materials, which is defined as frequency-dependent phase transition in ferroelectric materials. Hysteresis loops are observed when an external field is swept, regardless of vibration frequency of the bias, indicating relaxation behavior of the PMN-PT films.

Original languageEnglish
Pages (from-to)S833-S836
JournalJournal of the Korean Physical Society
Volume49
Issue numberSUPPL. 3
StatePublished - Dec 2006

Keywords

  • Piezoelectric
  • PMN-PT
  • Relaxor ferroelectric
  • Scanning force microscopy

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