Roles of the first atomic layers in growth of SrTiO3 films on LaAlO3 substrates

Dong Wook Kim, Dae Ho Kim, Bo Soo Kang, T. W. Noh, D. R. Lee, K. B. Lee

Research output: Contribution to journalArticlepeer-review

54 Scopus citations

Abstract

The roles of the first atomic layer for growth of heterostructures composed of the same AlO2-type perovskite crystal structures were investigated. LAO(001) single crystals were annealed at 1000-1100 °C for 10 hours under a flowing oxygen atmosphere and then transferred to a growth chamber. Reflection high energy electron diffraction (RHEED) and atomic force microscope (AFM) measurements revealed that the substrate had very clean and atomically flat surfaces. Related growth behaviors and structural properties of the films were characterized by RHEED, AFM, and high resolution X-ray diffraction (XRD) measurements.

Original languageEnglish
Pages (from-to)2176-2178
Number of pages3
JournalApplied Physics Letters
Volume74
Issue number15
DOIs
StatePublished - 12 Apr 1999

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