Robust Inspection of Integrated Circuit Substrates Based on Twin Network With Image Transform and Suppression Modules

Eunjeong Choi, Jeongtae Kim

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'Robust Inspection of Integrated Circuit Substrates Based on Twin Network With Image Transform and Suppression Modules'. Together they form a unique fingerprint.

Engineering