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Ridge formation and removal via annealing in exfoliated graphene

  • Sang A. Han
  • , In Sung Choi
  • , Hyo Sub An
  • , Hyunsoo Lee
  • , Hyeon Deuk Yong
  • , Sangwook Lee
  • , Jongwan Jung
  • , Nae Sung Lee
  • , Yongho Seo

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

It is well known that graphene is a very promising material due to its excellent physical, chemical, and thermal properties. Previousl ly, ridges in g raphene on a substrate were found in epitaxial graphene on a SiC substrate. It was found in this study that ridges can be made on a graphene layer via mechanical exfoliation on a sapphire substrate, and that ridges can be created or removed through heating and cooling. Due to the difference of the thermal-expansion coefficients of the substrate and graphene, it can be said that thermal cycling causes compressive strain, which is released by forming ridges. Annealing was carried out in a vacuum chamber within the pressure range of 10 -3∼10 -6 Torr and at 900∼1100 °C. To analyze the shapes and mechanical properties of the ridges, Raman spectroscopy and AFM measurement were performed. It was found that the ridges can be extended by defect as a nucleation center, and the graphene layer can be folded along the preexisting ridge during heating and cooling.

Original languageEnglish
Pages (from-to)5949-5954
Number of pages6
JournalJournal of Nanoscience and Nanotechnology
Volume11
Issue number7
DOIs
StatePublished - Jul 2011

Keywords

  • Annealing
  • Atomic Force Microscopy
  • Graphene
  • Graphite
  • Raman
  • Ridge

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