Reverse-poling effects on charge retention in Pb(Zr,Ti)O3(001)/LaNiO3(001) heterostructures

W. Jo; D. C. Kim; J. W. Hong

doi:10.1063/1.125763

Reverse-poling effects on charge retention in Pb(Zr,Ti)O₃(001)/LaNiO₃(001) heterostructures

W. Jo
, D. C. Kim
, J. W. Hong

Department of Physics

Research output: Contribution to journal › Article › peer-review

58 Scopus citations

Abstract

We report charge retention in preferentially c-axis oriented ferroelectric Pb(Zr,Ti)O₃ (PZT) thin films on LaNiO₃ by electrostatic force microscopy. The surface charge density of the PZT films was observed as a function of time in a selected area where a region is single poled and another region is reverse poled. Retention behaviors of the regions are very different: the single-poled region shows a declined response and the reverse-poled region reveals a retained characteristic. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films.

Original language	English
Pages (from-to)	390-392
Number of pages	3
Journal	Applied Physics Letters
Volume	76
Issue number	3
DOIs	https://doi.org/10.1063/1.125763
State	Published - 17 Jan 2000

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abstract = "We report charge retention in preferentially c-axis oriented ferroelectric Pb(Zr,Ti)O3 (PZT) thin films on LaNiO3 by electrostatic force microscopy. The surface charge density of the PZT films was observed as a function of time in a selected area where a region is single poled and another region is reverse poled. Retention behaviors of the regions are very different: the single-poled region shows a declined response and the reverse-poled region reveals a retained characteristic. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films.",

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AU - Kim, D. C.

AU - Hong, J. W.

PY - 2000/1/17

Y1 - 2000/1/17

N2 - We report charge retention in preferentially c-axis oriented ferroelectric Pb(Zr,Ti)O3 (PZT) thin films on LaNiO3 by electrostatic force microscopy. The surface charge density of the PZT films was observed as a function of time in a selected area where a region is single poled and another region is reverse poled. Retention behaviors of the regions are very different: the single-poled region shows a declined response and the reverse-poled region reveals a retained characteristic. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films.

AB - We report charge retention in preferentially c-axis oriented ferroelectric Pb(Zr,Ti)O3 (PZT) thin films on LaNiO3 by electrostatic force microscopy. The surface charge density of the PZT films was observed as a function of time in a selected area where a region is single poled and another region is reverse poled. Retention behaviors of the regions are very different: the single-poled region shows a declined response and the reverse-poled region reveals a retained characteristic. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films.

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DO - 10.1063/1.125763

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JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 3

ER -

Reverse-poling effects on charge retention in Pb(Zr,Ti)O3(001)/LaNiO3(001) heterostructures

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Reverse-poling effects on charge retention in Pb(Zr,Ti)O₃(001)/LaNiO₃(001) heterostructures