Reverse-poling effects on charge retention in Pb(Zr,Ti)O3(001)/LaNiO3(001) heterostructures

W. Jo, D. C. Kim, J. W. Hong

Research output: Contribution to journalArticlepeer-review

57 Scopus citations


We report charge retention in preferentially c-axis oriented ferroelectric Pb(Zr,Ti)O3 (PZT) thin films on LaNiO3 by electrostatic force microscopy. The surface charge density of the PZT films was observed as a function of time in a selected area where a region is single poled and another region is reverse poled. Retention behaviors of the regions are very different: the single-poled region shows a declined response and the reverse-poled region reveals a retained characteristic. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films.

Original languageEnglish
Pages (from-to)390-392
Number of pages3
JournalApplied Physics Letters
Issue number3
StatePublished - 17 Jan 2000


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