TY - GEN
T1 - Reliability of a system subject to a random shock process
AU - Cha, Ji Hwan
PY - 2010
Y1 - 2010
N2 - In this article, a stochastic failure model for a system operated under a randomly variable environment will be studied. The failure process of the system is assumed to depend not only on the baseline failure rate function of the system itself but also on the environmental shock process. The lifetime distribution of the system and its failure rate function will be derived. The effect of environmental factors on the failure process of the system will also be investigated. Lifetimes of systems operated under different environmental conditions are stochastically compared.
AB - In this article, a stochastic failure model for a system operated under a randomly variable environment will be studied. The failure process of the system is assumed to depend not only on the baseline failure rate function of the system itself but also on the environmental shock process. The lifetime distribution of the system and its failure rate function will be derived. The effect of environmental factors on the failure process of the system will also be investigated. Lifetimes of systems operated under different environmental conditions are stochastically compared.
UR - http://www.scopus.com/inward/record.url?scp=84861691076&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84861691076
SN - 9780415604277
T3 - Reliability, Risk and Safety: Back to the Future
SP - 1033
EP - 1037
BT - Reliability, Risk and Safety
T2 - European Safety and Reliability Annual Conference: Reliability, Risk and Safety: Back to the Future, ESREL 2010
Y2 - 5 September 2010 through 9 September 2010
ER -