Reducing Burn-In Loss of Organic Photovoltaics by a Robust Electron-Transporting Layer

Hyerim Oh, Ha Bin Sim, Seung Hee Han, Yong Ju Kwon, Jae Hyun Park, Myung Hwa Kim, Jin Young Kim, Won Suk Kim, Kyungkon Kim

Research output: Contribution to journalArticlepeer-review

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It is revealed that instability of interface between photoactive layer and electron-transporting layer (ETL) is one of the causes of the rapid degradation of organic photovoltaics (OPV) performance during initial operation (burn-in loss) under the light soaking. The stability of OPV is greatly enhanced by applying a robust ETL composed of TiO2 nanoparticles (TNPs). The TNPs bound with π–π interactive 3-phenylpentane-2,4-dione (TNP–Ph) form more robust ETLs than those bound with van der Waals interactive 3-methyl-2,4-pentanedione TNP (TNP–Me). The OPV with TNP–Ph maintains 73% of its initial power conversion efficiency (PCE) after 1000 h of light soaking, whereas the PCE of OPV with TNP–Me substantially reduces to 25% of initial PCE. The impedance analysis reveals that the burn-in loss is due to increase of resistance at the TNP ETL/photoactive layer interface during the light soaking. The transmission electron microscopy analysis shows that the TNP–Ph maintains most clear and robust interface with photoactive layer after the light-soaking test. This is attributed to the strong π–π interaction between phenyl rings of TNP–Ph. However, the TNP–Me bound with van der Waals interactive organic ligands penetrates the photoactive layer during the light-soaking test.

Original languageEnglish
Article number1900213
JournalAdvanced Materials Interfaces
Issue number12
StatePublished - 21 Jun 2019

Bibliographical note

Publisher Copyright:
© 2019 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim


  • burn-in loss
  • interfacial layers
  • organic solar cells
  • oxide nanoparticles
  • stability


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